Nonuniformity in the spatial distribution of negative luminescence in InAsSb(P) photodiodes (long-wavelength cutoff λ0.1 = 5.2 μm)

The spatial nonuniformity of negative luminescence and current crowding in InAsSb(P) mid-IR photodiodes is analyzed in relation to the applied voltage and contact size values. It is shown that this non-uniformity is one of the main causes of the poor sensitivity of photodiodes which have low dynamic...

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Published inSemiconductors (Woodbury, N.Y.) Vol. 46; no. 2; pp. 247 - 250
Main Authors Karandashev, S. A., Matveev, B. A., Mzhelskii, I. V., Polovinkin, V. G., Remennyi, M. A., Rybal’chenko, A. Yu, Stus’, N. M.
Format Journal Article
LanguageEnglish
Published Dordrecht SP MAIK Nauka/Interperiodica 01.02.2012
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