Radiation Hardened ReRAM Devices for Flexible Electronics - Lodhi, Anil; Dwivedi, Anurag; Saini, Shalu; Jingar, Naresh; Khandelwal, Arpit; Tiwari, Shree Prakash (IEEE journal on flexible electronics, 2023)
Keywords: Behavioral sciences; Electrodes; Flexible electronics; gamma radiation; Hafnium oxide; HfOx; Nonvolatile memory; Performance evaluation; resistive random access memory (ReRAM); Resistive switching; Switches