APA (7th ed.) Citation

Sem, S., Jenatsch, S., Züfle, S., Gadola, A., Hudson, D., Pflumm, C., & Ruhstaller, B. (2023). P‐120: Accelerated Lifetime Testing and Degradation Mechanisms of a Blue TADF OLED. SID International Symposium Digest of technical papers, 54(1), 1300-1303. https://doi.org/10.1002/sdtp.16819

Chicago Style (17th ed.) Citation

Sem, Stefano, Sandra Jenatsch, Simon Züfle, Arno Gadola, Daniel Hudson, Christof Pflumm, and Beat Ruhstaller. "P‐120: Accelerated Lifetime Testing and Degradation Mechanisms of a Blue TADF OLED." SID International Symposium Digest of Technical Papers 54, no. 1 (2023): 1300-1303. https://doi.org/10.1002/sdtp.16819.

MLA (9th ed.) Citation

Sem, Stefano, et al. "P‐120: Accelerated Lifetime Testing and Degradation Mechanisms of a Blue TADF OLED." SID International Symposium Digest of Technical Papers, vol. 54, no. 1, 2023, pp. 1300-1303, https://doi.org/10.1002/sdtp.16819.