Fully Atomistic Simulations of Phonon-Limited Mobility of Electrons and Holes in \langle \hbox\rangle-, \langle \hbox\rangle-, and \langle \hbox\rangle -Oriented Si Nanowires
Phonon-limited mobilities of electrons and holes in Si nanowires (NWs) with 〈001〉, 〈110〉, and 〈111〉 orientations are calculated in a fully atomistic framework for diameters up to 10 nm. Electron-phonon scattering rates are computed with an sp 3 d 5 s* tight-binding model for electrons and a valence-...
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Published in | IEEE transactions on electron devices Vol. 59; no. 5; pp. 1480 - 1487 |
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Main Authors | , , , |
Format | Journal Article |
Language | English |
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01.05.2012
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Abstract | Phonon-limited mobilities of electrons and holes in Si nanowires (NWs) with 〈001〉, 〈110〉, and 〈111〉 orientations are calculated in a fully atomistic framework for diameters up to 10 nm. Electron-phonon scattering rates are computed with an sp 3 d 5 s* tight-binding model for electrons and a valence-force field model for phonons. The Boltzmann equation is then solved exactly for the low-field mobility. Compared to bulk Si, the electron mobilities are strongly reduced, but the hole mobilities can be enhanced in 〈111〉 and 〈110〉 NWs with diameters around 3.5 nm. The mobility, however, rapidly decreases with carrier concentration >; 10 19 cm -3 . |
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AbstractList | Phonon-limited mobilities of electrons and holes in Si nanowires (NWs) with 〈001〉, 〈110〉, and 〈111〉 orientations are calculated in a fully atomistic framework for diameters up to 10 nm. Electron-phonon scattering rates are computed with an sp 3 d 5 s* tight-binding model for electrons and a valence-force field model for phonons. The Boltzmann equation is then solved exactly for the low-field mobility. Compared to bulk Si, the electron mobilities are strongly reduced, but the hole mobilities can be enhanced in 〈111〉 and 〈110〉 NWs with diameters around 3.5 nm. The mobility, however, rapidly decreases with carrier concentration >; 10 19 cm -3 . |
Author | Niquet, Y-M Delerue, C. Videau, B. Rideau, D. |
Author_xml | – sequence: 1 givenname: Y-M surname: Niquet fullname: Niquet, Y-M email: yann-michel.niquet@cea.fr organization: L_Sim, Inst. for Nanosci. & Cryogenics (INAC), Grenoble, France – sequence: 2 givenname: C. surname: Delerue fullname: Delerue, C. email: christophe.delerue@isen.fr organization: Inst. for Electron., Inst. Super. d'Electron. et du Numerique, Lille, France – sequence: 3 givenname: D. surname: Rideau fullname: Rideau, D. email: denis.rideau@st.com organization: STMicroelectron., Crolles, France – sequence: 4 givenname: B. surname: Videau fullname: Videau, B. organization: L_Sim, Inst. for Nanosci. & Cryogenics (INAC), Grenoble, France |
BookMark | eNp1kFFLwzAUhYMouE3fBV_yA8xM0rRNH8fcnDCdsPk2KGly6yJZI02H7k_5G23d8EmfLueec-6Fr49OK18BQleMDhmj2e1qcjfklPEhZzJNpTxBPRbHKckSkZyiHqVMkiyS0Tnqh_DWykQI3kNf051zezxq_NaGxmq8tNudU431VcC-xM8b3z4ic7u1DRj86AvrbLPvrIkD3dRdTlUGz7yDgG2F105Vrw7welP4z3X9I8jNf-uu-peFyaK2UHU_lxY_qcp_2BrCBTorlQtweZwD9DKdrMYzMl_cP4xHc6JZKhKihDSQmijjnGvNE2pEmamUJRBrVkjISsoZFFQUYJSUOk0jw7Xhkaa6ECyOBoge7urah1BDmb_Xdqvqfc5o3vHOW955xzs_8m4r14eKBYDfeNJy5rGIvgHv-IFX |
CODEN | IETDAI |
CitedBy_id | crossref_primary_10_1039_C4CS00084F crossref_primary_10_1021_nl3010995 crossref_primary_10_1063_1_4817527 crossref_primary_10_1063_1_4845515 crossref_primary_10_1103_PhysRevB_93_155303 crossref_primary_10_1063_1_4928525 crossref_primary_10_1063_1_4864376 crossref_primary_10_1063_1_4904856 crossref_primary_10_1039_C9NR03749G crossref_primary_10_1063_1_5094647 crossref_primary_10_1007_s10825_016_0865_7 crossref_primary_10_1039_C7CP08259B crossref_primary_10_3390_ma12010124 crossref_primary_10_1109_JQE_2020_3022380 crossref_primary_10_1109_TED_2018_2880966 crossref_primary_10_1109_TED_2017_2691406 crossref_primary_10_1109_TED_2014_2318896 crossref_primary_10_1109_TED_2014_2337713 crossref_primary_10_1088_2632_959X_acdb8a crossref_primary_10_1088_1361_6641_ab1e5b crossref_primary_10_1007_s10825_016_0851_0 crossref_primary_10_1103_PhysRevB_95_205401 crossref_primary_10_1021_acs_nanolett_5b04071 crossref_primary_10_1063_1_4903475 crossref_primary_10_1063_1_4966616 crossref_primary_10_1063_1_4759346 crossref_primary_10_1063_1_4975066 crossref_primary_10_1109_TED_2013_2248734 crossref_primary_10_1103_PhysRevB_93_035414 crossref_primary_10_1039_D3RA04051H crossref_primary_10_1021_acs_chemrev_8b00627 |
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ContentType | Journal Article |
DBID | 97E RIA RIE AAYXX CITATION |
DOI | 10.1109/TED.2012.2187788 |
DatabaseName | IEEE All-Society Periodicals Package (ASPP) 2005–Present IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE Electronic Library Online CrossRef |
DatabaseTitle | CrossRef |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library Online url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering |
EISSN | 1557-9646 |
EndPage | 1487 |
ExternalDocumentID | 10_1109_TED_2012_2187788 6164254 |
Genre | orig-research |
GroupedDBID | -~X .DC 0R~ 29I 3EH 4.4 5GY 5VS 6IK 97E AAJGR AASAJ ABQJQ ABVLG ACGFO ACGFS ACIWK ACKIV ACNCT AENEX AETIX AI. AIBXA AKJIK ALLEH ALMA_UNASSIGNED_HOLDINGS ASUFR ATWAV B-7 BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 EBS EJD F5P HZ~ H~9 IAAWW IBMZZ ICLAB IDIHD IFIPE IFJZH IPLJI JAVBF LAI M43 MS~ O9- OCL P2P RIA RIE RIG RNS TAE TN5 VH1 VJK VOH XFK AAYXX CITATION |
ID | FETCH-LOGICAL-c1746-a48de7d39222cc260d4f9a716e5c1b8e9f021eb04beda88c773d2cd23c0cb4153 |
IEDL.DBID | RIE |
ISSN | 0018-9383 |
IngestDate | Fri Aug 23 02:52:11 EDT 2024 Wed Jun 26 19:20:15 EDT 2024 |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 5 |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c1746-a48de7d39222cc260d4f9a716e5c1b8e9f021eb04beda88c773d2cd23c0cb4153 |
PageCount | 8 |
ParticipantIDs | crossref_primary_10_1109_TED_2012_2187788 ieee_primary_6164254 |
PublicationCentury | 2000 |
PublicationDate | 2012-May 2012-05-00 |
PublicationDateYYYYMMDD | 2012-05-01 |
PublicationDate_xml | – month: 05 year: 2012 text: 2012-May |
PublicationDecade | 2010 |
PublicationTitle | IEEE transactions on electron devices |
PublicationTitleAbbrev | TED |
PublicationYear | 2012 |
Publisher | IEEE |
Publisher_xml | – name: IEEE |
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References_xml | – ident: ref31 doi: 10.1103/PhysRevB.40.5657 – ident: ref35 doi: 10.1109/TED.2007.911096 – ident: ref6 doi: 10.1021/nl025875l – ident: ref10 doi: 10.1109/LED.2007.904890 – ident: ref15 doi: 10.1021/nl103278a – ident: ref32 doi: 10.1103/PhysRevB.73.165319 – ident: ref28 doi: 10.1109/IEDM.2010.5703324 – ident: ref34 doi: 10.1103/PhysRevB.82.115318 – ident: ref29 doi: 10.1063/1.3540689 – ident: ref26 doi: 10.1103/PhysRevB.82.115319 – volume: 293 start-page: 1289 year: 2001 ident: ref1 article-title: nanowire nanosensors for highly sensitive and selective detection of biological and chemical species publication-title: Science doi: 10.1126/science.1062711 contributor: fullname: cui – ident: ref30 doi: 10.1103/PhysRevB.79.245201 – ident: ref8 doi: 10.1021/nl060166j – ident: ref24 doi: 10.1021/nl9034384 – ident: ref5 doi: 10.1016/j.sse.2003.12.020 – ident: ref9 doi: 10.1109/IEDM.2007.4419093 – ident: ref23 doi: 10.1063/1.2974088 – volume: 6 start-page: 2442 year: 2006 ident: ref18 article-title: Giant enhancement of the carrier mobility in silicon nanowires with diamond coating publication-title: Nano Lett doi: 10.1021/nl061554o contributor: fullname: fonoberov – ident: ref20 doi: 10.1063/1.2802586 – ident: ref16 doi: 10.1103/PhysRevB.48.11067 – ident: ref3 doi: 10.1039/b718703n – ident: ref13 doi: 10.1109/LED.2009.2014975 – ident: ref2 doi: 10.1021/nl200114h – ident: ref21 doi: 10.1063/1.2977758 – ident: ref25 doi: 10.1103/PhysRevB.84.085313 – ident: ref36 doi: 10.1103/PhysRev.138.A225 – ident: ref14 doi: 10.1109/ICSICT.2010.5667872 – ident: ref27 doi: 10.1103/PhysRevB.80.155430 – ident: ref11 doi: 10.1063/1.2840187 – ident: ref22 doi: 10.1021/nl0727314 – ident: ref7 doi: 10.1109/LED.2006.873381 – volume: 8 start-page: 3636 year: 2008 ident: ref12 article-title: Silicon nanowire transistors with a channel width of 4 nm fabricated by atomic force microscope nanolithography publication-title: Nano Lett doi: 10.1021/nl801599k contributor: fullname: martinez – ident: ref33 doi: 10.1109/TED.2009.2035545 – ident: ref17 doi: 10.1063/1.1762695 – ident: ref4 doi: 10.1038/nature06381 – ident: ref19 doi: 10.1109/TNANO.2006.888521 |
SSID | ssj0016442 |
Score | 2.0611966 |
Snippet | Phonon-limited mobilities of electrons and holes in Si nanowires (NWs) with 〈001〉, 〈110〉, and 〈111〉 orientations are calculated in a fully atomistic framework... |
SourceID | crossref ieee |
SourceType | Aggregation Database Publisher |
StartPage | 1480 |
SubjectTerms | Effective mass Electron mobility Electron-phonon scattering Logic gates mobility nanowire (NW) Phonons Scattering Silicon simulation tight binding (TB) valence-force field |
Title | Fully Atomistic Simulations of Phonon-Limited Mobility of Electrons and Holes in \langle \hbox\rangle-, \langle \hbox\rangle-, and \langle \hbox\rangle -Oriented Si Nanowires |
URI | https://ieeexplore.ieee.org/document/6164254 |
Volume | 59 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1bS8MwFA7qkz54m-KdPPgimK22WdM8ijiGMBV0sIdBaZJTHGoju4DzR_kbPUm7KTLBtzZpaNqT9nxfcvIdQk61QZicZZyFEBvGc22YBC5ZiL4_b4KRsc9D1rmN211-02v2lsj5fC8MAPjgM6i7Q7-Wb6yeuKmyRozYHgnNMlkWUpZ7teYrBujXS2XwC_yAkXbNliQD2cBfgIvhCuvozoTwOVa-XdCPnCrepbQ2SGfWmTKS5Lk-Gau6_vil0_jf3m6S9Qpb0styMGyRJSi2ydoPxcEa-XSUc0ovx_bVKzTTh8FrlcBrRG1O759sYQtWbXuiHetjZ6eu6rpKmDOiWWFo2wlB0UFB-27G8wVo_0nZ9_7Qn7Dzv4pd00VVlN05wWV3z4cBxV--dRrKox3SbV0_XrVZlbKBaaQ2Mct4YkAYBF1hqDVyJcNzmSEng6a-UAnIHDEFqIArMFmSaCEiE2oTRjrQCrFEtEtW8DFhj1DVjDQPtExA4Xs0SkW5ykUWAxZyLsU-OZtZMX0rlTlSz2gCmaLFU2fxtLL4Pqk5-8yvq0xzsLj4kKy6xmVY4xFZGQ8ncIzQY6xO_Jj7AvDh2aI |
link.rule.ids | 315,783,787,799,27936,27937,55086 |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LS8QwEB50PagH3-L6zMGLYNbaZtvmKKKsj1VBBQ8LpUmmuKituLug_ih_o5O0u4ooeGuTPtJO2vm-ZPINwLY2BJPTVHAfQ8NFpg2XKCT3yfdnTTQydHnI2hdh61ac3jXvxmB3tBYGEV3wGTbsppvLN4Ue2KGyvZCwPRGacZggXB2H5Wqt0ZwBefZSG3yfPmEiXsNJSU_u0U_ARnH5DXJoUeSyrHw5oW9ZVZxTOZ6F9rA5ZSzJQ2PQVw39_kOp8b_tnYOZCl2yg7I7zMMY5gsw_U1zcBE-LOl8Ywf94slpNLPr7lOVwqvHioxd3Rd5kfNq4RNrFy569s1WHVUpc3oszQ1rWSko1s1Zx455PiLr3KvitfPidvjuX8X21N-qGL-0ksv2ntddRj_9wqoo95bg9vjo5rDFq6QNXBO5CXkqYoORIdjl-1oTWzIikymxMmzqfRWjzAhVoPKEQpPGsY6iwPja-IH2tCI0ESxDjR4TV4CpZqCFp2WMit6jUSrIVBalIVKhEDKqw87Qislzqc2ROE7jyYQsnliLJ5XF67Bo7TM6rjLN6u_FWzDZummfJ-cnF2drMGUvVAY5rkOt_zLADQIifbXp-t8ndTzc7Q |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Fully+Atomistic+Simulations+of+Phonon-Limited+Mobility+of+Electrons+and+Holes+in+%24%5Clangle+%5Chbox%7B001%7D%5Crangle%24-%2C+%24%5Clangle+%5Chbox%7B110%7D%5Crangle%24-%2C+and+%24%5Clangle+%5Chbox%7B111%7D%5Crangle%24+-Oriented+Si+Nanowires&rft.jtitle=IEEE+transactions+on+electron+devices&rft.au=Niquet%2C+Yann-Michel&rft.au=Delerue%2C+Christophe&rft.au=Rideau%2C+Denis&rft.au=Videau%2C+Brice&rft.date=2012-05-01&rft.issn=0018-9383&rft.eissn=1557-9646&rft.volume=59&rft.issue=5&rft.spage=1480&rft.epage=1487&rft_id=info:doi/10.1109%2FTED.2012.2187788&rft.externalDBID=n%2Fa&rft.externalDocID=10_1109_TED_2012_2187788 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0018-9383&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0018-9383&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0018-9383&client=summon |