APA (7th ed.) Citation

Mukherjee, A., Gupta, R., & Chatterjee, A. (2023). Guest Editorial Special Section on Signal Processing and Machine Learning in Intelligent Instrumentation, IEEE Open Journal of Instrumentation and Measurement. IEEE open journal of instrumentation and measurement, 2, 1-2. https://doi.org/10.1109/OJIM.2023.3334827

Chicago Style (17th ed.) Citation

Mukherjee, Anirban, Rajarshi Gupta, and Amitava Chatterjee. "Guest Editorial Special Section on Signal Processing and Machine Learning in Intelligent Instrumentation, IEEE Open Journal of Instrumentation and Measurement." IEEE Open Journal of Instrumentation and Measurement 2 (2023): 1-2. https://doi.org/10.1109/OJIM.2023.3334827.

MLA (9th ed.) Citation

Mukherjee, Anirban, et al. "Guest Editorial Special Section on Signal Processing and Machine Learning in Intelligent Instrumentation, IEEE Open Journal of Instrumentation and Measurement." IEEE Open Journal of Instrumentation and Measurement, vol. 2, 2023, pp. 1-2, https://doi.org/10.1109/OJIM.2023.3334827.