Face mask detection and counting using you only look once algorithm with Jetson Nano and NVDIA giga texel shader extreme

• Published in: IAES international journal of artificial intelligence Vol. 12; no. 3; p. 1169
• Main Authors: Fahd Al-Selwi, Hatem, Hassan, Nawaid, Ab Ghani, Hadhrami Bin, Binti Amir Hamzah, Nur Asyiqin, Bin Abd. Aziz, Azlan
• Format: Journal Article
• Language: English
• Published: 01.09.2023

Deep learning and machine learning are becoming more extensively adopted artificial intelligence techniques for machine vision problems in everyday life, giving rise to new capabilities in every sector of technology. It has a wide range of applications, ranging from autonomous driving to medical and...