Variational Bayes for analysis of masked data

• Published in: Journal of computational science Vol. 91; p. 102690
• Main Authors: Rai, Himanshu, Tomer, Sanjeev K.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.10.2025
• Subjects: Exponential family; Hazard plot; Markov chain Monte Carlo; Masked data; Variational Bayes; Hazard plot; Exponential family; Masked data; Variational Bayes; Markov chain Monte Carlo

Bayesian competing risks analysis in presence of masked data often leads to an intractable posterior, for which Markov chain Monte Carlo (MCMC) methods are frequently utilized to evaluate various estimators of interest. However, while analyzing several risks simultaneously, MCMC methods may consume...