Physics-Based Mathematical Models for Nanotechnology - Voon, Lok C Lew Yan; Melnik, Roderick; Willatzen, Morten (Journal of physics. Conference series, 2008)
Keywords: Applications of mathematics; Applied mathematics; Approximation; Atomic properties; Data processing; Eigenvalues; Engineering; Engineers; Interdisciplinary aspects; Magnetic properties; Mathematical analysis; Mathematical models; Mechanical properties; Miniaturization; Nanomaterials; Nanotechnology; Nonlinear systems; Optical disks; Optical properties; Optimization; Partial differential equations; Physics; Polarization; Quantum dots; Quantum mechanics; Quantum wells; Research centers; Scientists; Substrates; Supercomputers; Surface energy; Teams; Denmark; Canada; Mexico; United States--US