FPGA-based SPI Module System Implementation for Various DPS Evaluations in ATE

• Published in: Journal of semiconductor technology and science Vol. 25; no. 1; pp. 41 - 49
• Main Authors: Ji, Junhyeong, Park, Jonghee, Lee, Jiseok, Baek, Hwarang, Kim, Youbean
• Format: Journal Article
• Language: English
• Published: 대한전자공학회 01.02.2025
• Subjects: 전기공학
• ISSN: 2233-4866; 1598-1657; 1598-1657; 2233-4866
• DOI: 10.5573/JSTS.2025.25.1.41

The device power supply (DPS) utilized in automated test equipment (ATE) for semiconductor testing is responsible for applying and measuring voltage/current to the device under test (DUT). The choice of DPS in ATE can vary based on the equipment’s purpose, specifications, and the targeted DUT for me...