Organic depth profiling of C 60 and C 60 /phthalocyanine layers using argon clusters

• Published in: Surface and interface analysis Vol. 45; no. 1; pp. 163 - 166
• Main Authors: Mouhib, T., Poleunis, C., Möllers, R., Niehuis, E., Defrance, P., Bertrand, P., Delcorte, A.
• Format: Journal Article
• Language: English
• Published: 01.01.2013

Molecular semiconductor devices, such as light‐emitting diodes and photovoltaic cells, have recently received considerable attention because of their compatibility with flexible substrates and large‐area applications. Because of the importance of the interfacial properties for the performance of the...