Understanding the Slip Planarity and Residual Strain Field in Ti-6Al using Nanobeam Electron Diffraction and First Principles Calculations - Zhang, Ruopeng; Zhao, Shiteng; Pekin, Thomas; Rothchild, Eric; Asta, Mark; Chrzan, Daryl. C.; Minor, Andrew M. (Microscopy and microanalysis, 2019)
Keywords: Electron diffraction; First principles; In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies; Physical Science Symposia