Effective and group refractive index extraction and cross-sectional dimension estimation for silicon-on-insulator rib waveguides

The accurate determination of the effective and group refractive indices ( n eff and n g ) of optical waveguides as a function of wavelength is of critical importance to the design of photonic integrated circuits (PICs). This paper demonstrates the extraction of the two parameters of silicon-on-insu...

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Bibliographic Details
Published inOptics express Vol. 32; no. 18; p. 31375
Main Authors Zhang, Enge, Zhu, Xiaoran, Zhang, Lei
Format Journal Article
LanguageEnglish
Published 26.08.2024
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