Effective and group refractive index extraction and cross-sectional dimension estimation for silicon-on-insulator rib waveguides
The accurate determination of the effective and group refractive indices ( n eff and n g ) of optical waveguides as a function of wavelength is of critical importance to the design of photonic integrated circuits (PICs). This paper demonstrates the extraction of the two parameters of silicon-on-insu...
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Published in | Optics express Vol. 32; no. 18; p. 31375 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
26.08.2024
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Online Access | Get full text |
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