A Distance-Based Health Indicator and Its Use in an Interacting Multiple Model for Failure Prognosis in Power Electronic Devices - Yang, Qian; Joshi, Shailesh; Viviano, Raymond; Ukegawa, Hiroshi; Pattipati, Krishna R. (IEEE transactions on reliability, 2025)
Keywords: Adaptation models; Data models; Degradation; Extended Kalman filter (EKF); interacting multiple model (IMM); K-means; Mathematical models; MOSFET; power electronics; Predictive models; remaining useful life (RUL); Self-organizing feature maps; self-organizing map (SOM); Semiconductor device modeling; Switches; Vectors