A Distance-Based Health Indicator and Its Use in an Interacting Multiple Model for Failure Prognosis in Power Electronic Devices
Power electronic (PE) reliability is critical to electric vehicle performance and safety. Thus, it is vital to predict the remaining useful life (RUL) of components that are subject to predictable degradation. Here, we propose a RUL estimation framework for PE components. The framework has two conse...
Saved in:
Published in | IEEE transactions on reliability pp. 1 - 15 |
---|---|
Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
IEEE
04.02.2025
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Abstract | Power electronic (PE) reliability is critical to electric vehicle performance and safety. Thus, it is vital to predict the remaining useful life (RUL) of components that are subject to predictable degradation. Here, we propose a RUL estimation framework for PE components. The framework has two consecutive phases: Generation of distance-based health indicators through an unsupervised learning procedure, such as self-organizing map (SOM) or K-means clustering, and subsequent deployment of interacting multiple model (IMM) that integrate linear and extended Kalman filters with varied degradation profiles to forecast future values of the indicator and RUL. Specifically, a nominal SOM or K-means model is learned, using the on -state median signal data from the PE component. The indicator is then calculated by measuring the distance between the test vector and the cluster center. To adaptively track the health indicator and its rate of change, accounting for the noise intrinsic to degradation processes, various degradation profiles, and the measurement system, the IMMs are applied. The RUL is evaluated as the difference between a predefined threshold and the health indicator estimate, divided by the present degradation rate. Validation of the framework involved accelerated aging experimental datasets, encompassing both low-frequency and high-frequency switching scenarios. The results reveal the framework's versatility and potential for implementation across diverse applications. |
---|---|
AbstractList | Power electronic (PE) reliability is critical to electric vehicle performance and safety. Thus, it is vital to predict the remaining useful life (RUL) of components that are subject to predictable degradation. Here, we propose a RUL estimation framework for PE components. The framework has two consecutive phases: Generation of distance-based health indicators through an unsupervised learning procedure, such as self-organizing map (SOM) or K-means clustering, and subsequent deployment of interacting multiple model (IMM) that integrate linear and extended Kalman filters with varied degradation profiles to forecast future values of the indicator and RUL. Specifically, a nominal SOM or K-means model is learned, using the on -state median signal data from the PE component. The indicator is then calculated by measuring the distance between the test vector and the cluster center. To adaptively track the health indicator and its rate of change, accounting for the noise intrinsic to degradation processes, various degradation profiles, and the measurement system, the IMMs are applied. The RUL is evaluated as the difference between a predefined threshold and the health indicator estimate, divided by the present degradation rate. Validation of the framework involved accelerated aging experimental datasets, encompassing both low-frequency and high-frequency switching scenarios. The results reveal the framework's versatility and potential for implementation across diverse applications. |
Author | Ukegawa, Hiroshi Yang, Qian Joshi, Shailesh Viviano, Raymond Pattipati, Krishna R. |
Author_xml | – sequence: 1 givenname: Qian orcidid: 0000-0002-9870-1133 surname: Yang fullname: Yang, Qian organization: University of Connecticut, Storrs, CT, USA – sequence: 2 givenname: Shailesh orcidid: 0000-0001-7218-1187 surname: Joshi fullname: Joshi, Shailesh organization: Toyota Research Institute of North America, Ann Arbor, MI, USA – sequence: 3 givenname: Raymond orcidid: 0000-0002-9051-5037 surname: Viviano fullname: Viviano, Raymond organization: Toyota Research Institute of North America, Ann Arbor, MI, USA – sequence: 4 givenname: Hiroshi surname: Ukegawa fullname: Ukegawa, Hiroshi organization: Toyota Research Institute of North America, Ann Arbor, MI, USA – sequence: 5 givenname: Krishna R. orcidid: 0000-0002-0565-181X surname: Pattipati fullname: Pattipati, Krishna R. organization: University of Connecticut, Storrs, CT, USA |
BookMark | eNpNkMFOAjEQhhujiYievXjoCyy03d1ue0QEIYFICJw3pTvFmrUlbdF489FdAgeTSSZ__vnm8N2ha-cdIPRIyYBSIoeb9YARVg7ykvFSFleoR8tSZLRi9Br1CKEikyWTt-guxo8uFoUUPfQ7wi82JuU0ZM8qQoNnoNr0jueusVolH7ByDZ6niLcRsHVd7LoEQelk3R4vj22yhxbw0jfQYtMBU2XbYwC8Cn7vfLTxhK38NwQ8aUGn4J3V-AW-rIZ4j26MaiM8XHYfbaeTzXiWLd5e5-PRItO04CmTqiGVEFLSqjE72o0ARlmpuTaGGSBATUN4pSUju4rTXFXCGM4LmTOtGpP30fD8VwcfYwBTH4L9VOGnpqQ-Caw36_oksL4I7IinM2EB4N-14FLkPP8DvIRvhg |
CODEN | IERQAD |
ContentType | Journal Article |
DBID | 97E RIA RIE AAYXX CITATION |
DOI | 10.1109/TR.2025.3526594 |
DatabaseName | IEEE All-Society Periodicals Package (ASPP) 2005–Present IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE Electronic Library (IEL) CrossRef |
DatabaseTitle | CrossRef |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library (IEL) url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering |
EISSN | 1558-1721 |
EndPage | 15 |
ExternalDocumentID | 10_1109_TR_2025_3526594 10869836 |
Genre | orig-research |
GroupedDBID | -~X .DC 0R~ 29I 4.4 5GY 5VS 6IK 97E AAJGR AARMG AASAJ AAWTH ABAZT ABQJQ ABVLG ACGFO ACGFS ACIWK ACNCT AENEX AGQYO AHBIQ AKJIK AKQYR ALMA_UNASSIGNED_HOLDINGS ASUFR ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 EBS IFIPE IPLJI JAVBF LAI M43 MS~ OCL P2P RIA RIE RNS TN5 8WZ A6W AAYXX AETIX AGSQL AI. AIBXA ALLEH CITATION EJD H~9 IAAWW IBMZZ ICLAB IDIHD IFJZH RIG VH1 VJK |
ID | FETCH-LOGICAL-c146t-9ad07889917dfb1fb18e2125c6cff2fe0e1fd067c920b7613a78ff664932cadf3 |
IEDL.DBID | RIE |
ISSN | 0018-9529 |
IngestDate | Tue Jul 01 00:49:12 EDT 2025 Wed Aug 27 01:53:39 EDT 2025 |
IsPeerReviewed | true |
IsScholarly | true |
Language | English |
License | https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html https://doi.org/10.15223/policy-029 https://doi.org/10.15223/policy-037 |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c146t-9ad07889917dfb1fb18e2125c6cff2fe0e1fd067c920b7613a78ff664932cadf3 |
ORCID | 0000-0002-0565-181X 0000-0001-7218-1187 0000-0002-9051-5037 0000-0002-9870-1133 |
PageCount | 15 |
ParticipantIDs | ieee_primary_10869836 crossref_primary_10_1109_TR_2025_3526594 |
ProviderPackageCode | CITATION AAYXX |
PublicationCentury | 2000 |
PublicationDate | 2025-02-04 |
PublicationDateYYYYMMDD | 2025-02-04 |
PublicationDate_xml | – month: 02 year: 2025 text: 2025-02-04 day: 04 |
PublicationDecade | 2020 |
PublicationTitle | IEEE transactions on reliability |
PublicationTitleAbbrev | TR |
PublicationYear | 2025 |
Publisher | IEEE |
Publisher_xml | – name: IEEE |
SSID | ssj0014498 |
Score | 2.4230635 |
Snippet | Power electronic (PE) reliability is critical to electric vehicle performance and safety. Thus, it is vital to predict the remaining useful life (RUL) of... |
SourceID | crossref ieee |
SourceType | Index Database Publisher |
StartPage | 1 |
SubjectTerms | Adaptation models Data models Degradation Extended Kalman filter (EKF) interacting multiple model (IMM) K-means Mathematical models MOSFET power electronics Predictive models remaining useful life (RUL) Self-organizing feature maps self-organizing map (SOM) Semiconductor device modeling Switches Vectors |
Title | A Distance-Based Health Indicator and Its Use in an Interacting Multiple Model for Failure Prognosis in Power Electronic Devices |
URI | https://ieeexplore.ieee.org/document/10869836 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LS8QwEA7qSQ8-V3wzBw9euvaRps1RXRdXWBHZBW8lSSeyKF1xuxdP_nQnaZVVEIQe2tJAyKQz35d5MXaKypaYRDYgQmsCnqdhoBF1kGoVCZS5kMolJw_vxM2Y3z6mj22yus-FQUQffIZdd-t9-eXUzN1R2bnrCiTzRCyzZWJuTbLWt8uAc9mqXfqD01i2dXyiUJ6PHogIxmnX14KX_IcJWuip4k1Kf4PdfU2miSR57s5r3TXvv-o0_nu2m2y9BZdw0eyGLbaE1TZbWyg5uMM-LqDnICPJOrgkC1ZCk4gEg8p5bIiBg6pKGNQzGM8QJhU9gj82dBkQ1RMM2whEcF3UXoAwL_TVxAW3w_3b1IXtTWZu2L1rvwbX3112oIdeKXXYuH89uroJ2i4MgSEtWgdSlQQjiJZFWWl1RFeOZO9SI4y1scUQI1uSzTMyDnVG6EBlubVCcEKGRpU22WUr1bTCPQahiYSQNjVZZLkOlY65ShKDhDIzQbxnn519CaZ4bYptFJ6khLIYPRROhkUrw33WcSu-8Fmz2Ad_vD9kq264j7fmR2ylfpvjMcGJWp_4bfQJOSDIYA |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwzV1Lb9NAEB6VcgAOPIsozzmAxMWpH-uN98ChkEYJbaqqSqTezO56FkUgByWOEJz4I_wVfhuzazcKSBwrIflgW7Yl736amW_3mxmAl6RdRVniIia0NhJFHkeGyES50YkkVUilfXLy5FSOZuL9RX6xAz83uTBEFMRn1POnYS-_Wti1Xyo78F2BVJHJTkN5TN--MkNbvRkPeDpfpenwaPpuFHVNBCLLRqCJlK7YCzKrSPqVMwkfBbG5zq20zqWOYkpcxSbbqjQ2zOkz3S-ck1JwYGN15TL-7jW4zoFGnrbpYZtNCiFUZ-jZZuSp6ioHJbE6mJ4z9UzzXqg-r8QfTm-ri0twYsM78Ovy91vtyqfeujE9-_2vypD_7fjchdtd-IyHLd7vwQ7V9-HWVlHFB_DjEAc-KGY0R2_ZR1fYplrhuPZ7Us1iibqucNyscLYinNd8iWFh1Od41B9x0mks0feJ-4wc1eNQz718H8-WCy9MnK_8a2e-wRwebfoI4YCC2d2D2ZUMwUPYrRc1PQKMbSKlcrntJ06YWJtU6CyzxHF0XzKz24fXl0Aov7TlRMpAw2JVTs9Lj5myw8w-7PkZ3nqsndzH_7j_Am6MppOT8mR8evwEbvpPBXW5eAq7zXJNzzh4aszzAGGED1eNid_6oSbt |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=A+Distance-Based+Health+Indicator+and+Its+Use+in+an+Interacting+Multiple+Model+for+Failure+Prognosis+in+Power+Electronic+Devices&rft.jtitle=IEEE+transactions+on+reliability&rft.au=Yang%2C+Qian&rft.au=Joshi%2C+Shailesh&rft.au=Viviano%2C+Raymond&rft.au=Ukegawa%2C+Hiroshi&rft.date=2025-02-04&rft.pub=IEEE&rft.issn=0018-9529&rft.spage=1&rft.epage=15&rft_id=info:doi/10.1109%2FTR.2025.3526594&rft.externalDocID=10869836 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0018-9529&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0018-9529&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0018-9529&client=summon |