FUZYE: A Fuzzy -Means Analog IC Yield Optimization Using Evolutionary-Based Algorithms
This paper presents fuzzy c-means-based yield estimation (FUZYE), a methodology that reduces the time impact caused by Monte Carlo (MC) simulations in the context of analog integrated circuits (ICs) yield estimation, enabling it for yield optimization with population-based algorithms, e.g., the gene...
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Published in | IEEE transactions on computer-aided design of integrated circuits and systems Vol. 39; no. 1; pp. 1 - 13 |
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Main Authors | , , , , , , |
Format | Journal Article |
Language | English |
Published |
New York
IEEE
01.01.2020
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
Online Access | Get full text |
ISSN | 0278-0070 1937-4151 |
DOI | 10.1109/TCAD.2018.2883978 |
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