FUZYE: A Fuzzy -Means Analog IC Yield Optimization Using Evolutionary-Based Algorithms

This paper presents fuzzy c-means-based yield estimation (FUZYE), a methodology that reduces the time impact caused by Monte Carlo (MC) simulations in the context of analog integrated circuits (ICs) yield estimation, enabling it for yield optimization with population-based algorithms, e.g., the gene...

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Bibliographic Details
Published inIEEE transactions on computer-aided design of integrated circuits and systems Vol. 39; no. 1; pp. 1 - 13
Main Authors Canelas, Antonio, Povoa, Ricardo, Martins, Ricardo, Lourenco, Nuno, Guilherme, Jorge, Carvalho, Joao Paulo, Horta, Nuno
Format Journal Article
LanguageEnglish
Published New York IEEE 01.01.2020
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Online AccessGet full text
ISSN0278-0070
1937-4151
DOI10.1109/TCAD.2018.2883978

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