A 1.8e ^} Temporal Noise Over 110-dB-Dynamic Range 3.4 \mu \text Pixel Pitch Global-Shutter CMOS Image Sensor With Dual-Gain Amplifiers SS-ADC, Light Guide Structure, and Multiple-Accumulation Shutter

• Published in: IEEE journal of solid-state circuits Vol. 53; no. 1; pp. 219 - 228
• Main Authors: Kobayashi, Masahiro, Onuki, Yusuke, Kawabata, Kazunari, Sekine, Hiroshi, Tsuboi, Toshiki, Muto, Takashi, Akiyama, Takeshi, Matsuno, Yasushi, Takahashi, Hidekazu, Koizumi, Toru, Sakurai, Katsuhito, Yuzurihara, Hiroshi, Inoue, Shunsuke, Ichikawa, Takeshi
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.01.2018; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Accumulation; Adaptive signal detection; Amplification; Amplifiers; Analog to digital converters; Apertures; CMOS; CMOS image sensors; CMOS integrated circuits; Digital cameras; Digital imaging; Dynamic range; Gain; image enhancement; image quality; image restoration; Image sensors; Linearity; linearization techniques; Low noise; Micromechanical devices; Noise; Noise levels; Noise sensitivity; optical design; Pixels; Program processors; Saturation; Sensitivity; Sensors; Shape memory; Timing

A 1.8e rms - temporal noise over 110 dB dynamic range 3.4 μm pixel pitch global shutter (GS) CMOS image sensor (C'S) single-slope analog digital converters (ADCs) with dual-gain amplifier (SSDG-ADC), light guide (LG) structure, and multiple-accumulation shutter has been developed for various ac...