DARN: A Dual Attention Refinement Network for Enhancing Feature Robustness in VEP-Based EEG Biometrics - Liu, Honggang; Yang, Han; Liu, Dongjun; Yi, Hangjie; He, Bingfeng; Peng, Yong; Kong, Wanzeng (IEEE transactions on information forensics and security, 2025)
Keywords: Accuracy; Authentication; Biometrics; Brain modeling; Data mining; Deep learning; Electroencephalogram(EEG); Electroencephalography; Feature extraction; person identification; Robustness; visual evoked potentials; Visualization