P‐161: Full‐in‐situ Imaging and Laser Processing System Supporting Detection and Removal of Defective Micro‐LED Dies During Mass Transfer - Cao, Yuxuan; Yang, Kuai; Zhang, Zhen (SID International Symposium Digest of technical papers, 2024)
Keywords: Display devices; fault dies detection and removal; galvanometer scanner; in‐situ observation and processing; laser mass transfer; Laser processing; Light emitting diodes; Mass production; Mass transfer; Micro‐LED; Misalignment