Unified simulation platform for interference microscopy
Interferometric scattering microscopy is a powerful technique that enables various applications, such as mass photometry and particle tracking. Here we present a numerical toolbox to simulate images obtained in interferometric scattering, coherent bright-field, and dark-field microscopy. The scatter...
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| Main Authors | , , , , , , |
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| Format | Journal Article |
| Language | English |
| Published |
13.05.2024
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| Subjects | |
| Online Access | Get full text |
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| Abstract | Interferometric scattering microscopy is a powerful technique that enables
various applications, such as mass photometry and particle tracking. Here we
present a numerical toolbox to simulate images obtained in interferometric
scattering, coherent bright-field, and dark-field microscopy. The scattered
fields are calculated using a boundary element method, facilitating the
simulation of arbitrary sample geometries and substrate layer structures. A
fully vectorial model is used for simulating the imaging setup. We demonstrate
excellent agreement between our simulations and experiments for different
shapes of scatterers and excitation angles. Notably, for angles near the
Brewster angle, we observe a contrast enhancement which may be beneficial for
nanosensing applications. The software is available as a Matlab toolbox. |
|---|---|
| AbstractList | Interferometric scattering microscopy is a powerful technique that enables
various applications, such as mass photometry and particle tracking. Here we
present a numerical toolbox to simulate images obtained in interferometric
scattering, coherent bright-field, and dark-field microscopy. The scattered
fields are calculated using a boundary element method, facilitating the
simulation of arbitrary sample geometries and substrate layer structures. A
fully vectorial model is used for simulating the imaging setup. We demonstrate
excellent agreement between our simulations and experiments for different
shapes of scatterers and excitation angles. Notably, for angles near the
Brewster angle, we observe a contrast enhancement which may be beneficial for
nanosensing applications. The software is available as a Matlab toolbox. |
| Author | Platzer, Barbara Juffmann, Thomas Zykov, Ilia Hitzelhammer, Felix Dostálová, Anežka Conrad-Billroth, Clara Hohenester, Ulrich |
| Author_xml | – sequence: 1 givenname: Felix surname: Hitzelhammer fullname: Hitzelhammer, Felix – sequence: 2 givenname: Anežka surname: Dostálová fullname: Dostálová, Anežka – sequence: 3 givenname: Ilia surname: Zykov fullname: Zykov, Ilia – sequence: 4 givenname: Barbara surname: Platzer fullname: Platzer, Barbara – sequence: 5 givenname: Clara surname: Conrad-Billroth fullname: Conrad-Billroth, Clara – sequence: 6 givenname: Thomas surname: Juffmann fullname: Juffmann, Thomas – sequence: 7 givenname: Ulrich surname: Hohenester fullname: Hohenester, Ulrich |
| BackLink | https://doi.org/10.48550/arXiv.2405.07521$$DView paper in arXiv |
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| Snippet | Interferometric scattering microscopy is a powerful technique that enables
various applications, such as mass photometry and particle tracking. Here we
present... |
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| Title | Unified simulation platform for interference microscopy |
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