Magnetic and structural properties of Co2FeAl thin films grown on Si substrate

• Published in: arXiv.org
• Main Authors: Belmeguenai, M, Tuzcuoglu, H, Gabor, M S, Petrisor, T, Tuisan, C, Berling, D, Zighem, F, Chérif, S M
• Format: Paper Journal Article
• Language: English
• Published: Ithaca Cornell University Library, arXiv.org 28.03.2014
• Subjects: Anisotropy; Coercivity; Ferromagnetic resonance; Ferromagnetism; Film thickness; Hysteresis loops; Kerr magnetooptical effect; Magnetic properties; Magnetism; Microstrip transmission lines; Orientation effects; Physics - Materials Science; Pole figures; Silicon dioxide; Silicon substrates; Thin films
• DOI: 10.48550/arxiv.1403.7566

The correlation between magnetic and structural properties of Co_{2} FeAl (CFA) thin films of different thickness (10 nm<d< 100 nm) grown at room temperature on MgO-buffered Si/SiO2 substrates and annealed at 600\lyxmathsym{\textdegree}C has been studied. XRD measurements revealed an (011) out-of-plane texture growth of the films. The deduced lattice parameter increases with the film thickness. Moreover, pole figures showed no in-plane preferential growth orientation. The magneto-optical Kerr effect hysteresis loops showed the presence of a weak in-plane uniaxial anisotropy with a random easy axis direction. The coercive field measured with an applied field along the easy axis direction and the uniaxial anisotropy field increase linearly with the inverse of the CFA thickness. The microstrip line ferromagnetic resonance measurements for in-plane and perpendicular applied magnetic fields revealed that the effective magnetization and the uniaxial in-palne anisotropy field follow a linear variation versus the inverse CFA thickness. This allows deriving a perpendicular surface anisotropy coefficient of -1.86 erg/cm2