Spatially Resolved Mapping of Electrical Conductivity across Individual Domain (Grain) Boundaries in Graphene

• Published in: ACS nano Vol. 7; no. 9; pp. 7956 - 7966
• Main Authors: Clark, Kendal W, Zhang, X.-G, Vlassiouk, Ivan V, He, Guowei, Feenstra, Randall M, Li, An-Ping
• Format: Journal Article
• Language: English
• Published: United States American Chemical Society 24.09.2013
• Subjects: Boundaries; Chemical vapor deposition; Crystal defects; Electronics; Grain boundaries; Grains; Graphene; Nanostructure; Silicon carbide; defect; electronic transport; potentiometry; scanning tunneling microscopy; grain boundary; graphene

All large-scale graphene films contain extended topological defects dividing graphene into domains or grains. Here, we spatially map electronic transport near specific domain and grain boundaries in both epitaxial graphene grown on SiC and CVD graphene on Cu subsequently transferred to a SiO2 substr...