Spatially Resolved Mapping of Electrical Conductivity across Individual Domain (Grain) Boundaries in Graphene - Clark, Kendal W; Zhang, X.-G; Vlassiouk, Ivan V; He, Guowei; Feenstra, Randall M; Li, An-Ping (ACS nano, 2013)
Keywords: Boundaries; Chemical vapor deposition; Crystal defects; Electronics; Grain boundaries; Grains; Graphene; Nanostructure; Silicon carbide; defect; electronic transport; potentiometry; scanning tunneling microscopy; grain boundary; graphene