A comparative analysis of the efficiency of change metrics and static code attributes for defect prediction

• Published in: 2008 ACM/IEEE 30th International Conference on Software Engineering Vol. 2008; no. 24; pp. 181 - 190
• Main Authors: Moser, R., Pedrycz, W., Succi, G.
• Format: Conference Proceeding Journal Article
• Language: English
• Published: IEEE 01.01.2008
• Subjects: Classification tree analysis; cost-sensitive classification; Costs; defect prediction; Java; Logistics; Permission; Predictive models; Resource management; Software engineering; Software metrics; Testing

In this paper we present a comparative analysis of the predictive power of two different sets of metrics for defect prediction. We choose one set of product related and one set of process related software metrics and use them for classifying Java files of the Eclipse project as defective respective...