Advanced Computing in Electron Microscopy

• Main Author: Kirkland, Earl J
• Format: eBook Book
• Language: English
• Published: New York Springer Science + Business Media 2010; Springer; Springer US
• Edition: 2. Aufl.
• Subjects: Characterization and Evaluation of Materials; Computer simulation; Electrical Engineering; Electron microscopy; Electron microscopy > Computer simulation; Image processing; Numeric Computing; Physics; Physics and Astronomy; Spectroscopy and Microscopy; Technik; Wissen Chemie

This book provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculati...