Advanced Computing in Electron Microscopy

This book provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculati...

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Bibliographic Details
Main Author Kirkland, Earl J
Format eBook Book
LanguageEnglish
Published New York Springer Science + Business Media 2010
Springer
Springer US
Edition2. Aufl.
Subjects
Characterization and Evaluation of Materials
Computer simulation
Electrical Engineering
Electron microscopy
Electron microscopy > Computer simulation
Image processing
Numeric Computing
Physics
Physics and Astronomy
Spectroscopy and Microscopy
Technik
Wissen Chemie
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Table of Contents:
  • Intro -- Advanced Computing in Electron Microscopy -- Preface -- Contents -- 1 Introduction -- 2 The Transmission Electron Microscope -- 3 Linear Image Approximations -- 4 Sampling and the Fast Fourier Transform -- 5 Calculation of Images of Thin Specimens -- 6 Theory of Calculation of Images of Thick Specimens -- 7 Multislice Applications and Examples -- 8 The Programs -- Appendix A: Plotting Transfer Functions -- Appendix B: The Fourier Projection Theorem -- Appendix C: Atomic Potentials and Scattering Factors -- Appendix D: Bilinear Interpolation -- Appendix E: 3D Perspective View -- References -- Index