Feng, Y., Chen, Q., Jiang, M., & Yao, J. (2019). Tailoring the Properties of UiO-66 through Defect Engineering: A Review. Industrial & engineering chemistry research, 58(38), 17646-17659. https://doi.org/10.1021/acs.iecr.9b03188
Chicago Style (17th ed.) CitationFeng, Yi, Qian Chen, Minqi Jiang, and Jianfeng Yao. "Tailoring the Properties of UiO-66 Through Defect Engineering: A Review." Industrial & Engineering Chemistry Research 58, no. 38 (2019): 17646-17659. https://doi.org/10.1021/acs.iecr.9b03188.
MLA (9th ed.) CitationFeng, Yi, et al. "Tailoring the Properties of UiO-66 Through Defect Engineering: A Review." Industrial & Engineering Chemistry Research, vol. 58, no. 38, 2019, pp. 17646-17659, https://doi.org/10.1021/acs.iecr.9b03188.
Warning: These citations may not always be 100% accurate.