Dephasing Mechanisms of Topologically Protected 2D Surface Carriers in Sputtered SnTe Thin Films - Beryani Nezafat, Negin; Bhattacharya, Ahana; Izadi, Sepideh; Ennen, Inga; Wortmann, Martin; Schnatmann, Lauritz; Solaymani, Shahram; Kulesza, Sławomir; Bramowicz, Miroslaw; Westphal, Michael; Biedinger, Jan; Rott, Karsten; et al. (Nano letters, 2025)
Keywords: Letter; Thin films; Topological insulator; Electron−electron interaction; Weak antilocalization