Improving Datapath Testability by Modifying Controller Specification

• Published in: VLSI Design Vol. 2002; no. 2; pp. 491 - 498
• Main Authors: Flottes, M. L., Rouzeyre, B., Volpe, L.
• Format: Journal Article
• Language: English
• Published: Hindawi Limiteds 2002; Hindawi Publishing Corporation
• Subjects: Engineering Sciences; Micro and nanotechnologies; Microelectronics; FSM; DFT; Testability; Controller specification; Datapath; Test control

A digital circuit includes two main parts: a controller and a datapath. After connection of these two parts, both are subject to a sharp fall in testability due to the lack of controllability and observability at the interface. In this paper, we propose a method for specifying the control part in or...