X-ray Reflectivity and Diffraction Studies on Lipid and Lipopolymer Langmuir−Blodgett Films under Controlled Humidity

• Published in: Journal of the American Chemical Society Vol. 124; no. 32; pp. 9412 - 9421
• Main Authors: Bolze, Jörg, Takahasi, Masamitu, Mizuki, Jun'ichiro, Baumgart, Tobias, Knoll, Wolfgang
• Format: Journal Article
• Language: English
• Published: Washington, DC American Chemical Society 14.08.2002
• Subjects: Chemistry; Exact sciences and technology; General and physical chemistry; Langmuir blodgett films; Surface physical chemistry; Structure effect; Liquid solid interface; Grazing incidence; Chain length; Phospholipid; Experimental study; X ray diffraction; Phosphorus Organic compounds; Ethylene oxide polymer; Interface structure; Mixed monolayer; X ray reflection; Aliphatic polymer; Semiconductor substrate; Langmuir Blodgett layer

Synchrotron X-ray reflectivity and grazing incidence diffraction were applied to study the structures of phospholipid Langmuir−Blodgett films under controlled humidity. Distearoylphosphatidylethanolamine (DSPE) and DSPE−PEO lipopolymers, in which a poly(ethylene oxide) chain with n = 8, 17, or 45 EO...