Detection of Charge Storage on Molecular Thin Films of Tris(8-hydroxyquinoline) Aluminum (Alq3) by Kelvin Force Microscopy: A Candidate System for High Storage Capacity Memory Cells

Retention and diffusion of charge in tris­(8-hydroxyquinoline) aluminum (Alq3) molecular thin films are investigated by injecting electrons and holes via a biased conductive atomic force microscopy tip into the Alq3 films. After the charge injection, Kelvin force microscopy measurements reveal minim...

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Published inNano letters Vol. 12; no. 3; pp. 1260 - 1264
Main Authors Paydavosi, Sarah, Aidala, Katherine E, Brown, Patrick R, Hashemi, Pouya, Supran, Geoffrey J, Osedach, Timothy P, Hoyt, Judy L, Bulović, Vladimir
Format Journal Article
LanguageEnglish
Published Washington, DC American Chemical Society 14.03.2012
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Abstract Retention and diffusion of charge in tris­(8-hydroxyquinoline) aluminum (Alq3) molecular thin films are investigated by injecting electrons and holes via a biased conductive atomic force microscopy tip into the Alq3 films. After the charge injection, Kelvin force microscopy measurements reveal minimal changes with time in the spatial extent of the trapped charge domains within Alq3 films, even for high hole and electron densities of >1012 cm–2. We show that this finding is consistent with the very low mobility of charge carriers in Alq3 thin films (<10–7 cm2/(Vs)) and that it can benefit from the use of Alq3 films as nanosegmented floating gates in flash memory cells. Memory capacitors using Alq3 molecules as the floating gate are fabricated and measured, showing durability over more than 104 program/erase cycles and the hysteresis window of up to 7.8 V, corresponding to stored charge densities as high as 5.4 × 1013 cm–2. These results demonstrate the potential for use of molecular films in high storage capacity nonvolatile memory cells.
AbstractList Retention and diffusion of charge in tris(8-hydroxyquinoline) aluminum (Alq(3)) molecular thin films are investigated by injecting electrons and holes via a biased conductive atomic force microscopy tip into the Alq(3) films. After the charge injection, Kelvin force microscopy measurements reveal minimal changes with time in the spatial extent of the trapped charge domains within Alq(3) films, even for high hole and electron densities of >10(12) cm(-2). We show that this finding is consistent with the very low mobility of charge carriers in Alq(3) thin films (<10(-7) cm(2)/(Vs)) and that it can benefit from the use of Alq(3) films as nanosegmented floating gates in flash memory cells. Memory capacitors using Alq(3) molecules as the floating gate are fabricated and measured, showing durability over more than 10(4) program/erase cycles and the hysteresis window of up to 7.8 V, corresponding to stored charge densities as high as 5.4 × 10(13) cm(-2). These results demonstrate the potential for use of molecular films in high storage capacity nonvolatile memory cells.
Retention and diffusion of charge in tris(8-hydroxyquinoline) aluminum (Alq sub(3)) molecular thin films are investigated by injecting electrons and holes via a biased conductive atomic force microscopy tip into the Alq sub(3) films. After the charge injection, Kelvin force microscopy measurements reveal minimal changes with time in the spatial extent of the trapped charge domains within Alq sub(3) films, even for high hole and electron densities of >10 super(12) cm super(-2). We show that this finding is consistent with the very low mobility of charge carriers in Alq sub(3) thin films (<10 super(-7) cm super(2)/(Vs)) and that it can benefit from the use of Alq sub(3) films as nanosegmented floating gates in flash memory cells. Memory capacitors using Alq sub(3) molecules as the floating gate are fabricated and measured, showing durability over more than 10 super(4) program/erase cycles and the hysteresis window of up to 7.8 V, corresponding to stored charge densities as high as 5.4 10 super(13) cm super(-2). These results demonstrate the potential for use of molecular films in high storage capacity nonvolatile memory cells.
Retention and diffusion of charge in tris­(8-hydroxyquinoline) aluminum (Alq3) molecular thin films are investigated by injecting electrons and holes via a biased conductive atomic force microscopy tip into the Alq3 films. After the charge injection, Kelvin force microscopy measurements reveal minimal changes with time in the spatial extent of the trapped charge domains within Alq3 films, even for high hole and electron densities of >1012 cm–2. We show that this finding is consistent with the very low mobility of charge carriers in Alq3 thin films (<10–7 cm2/(Vs)) and that it can benefit from the use of Alq3 films as nanosegmented floating gates in flash memory cells. Memory capacitors using Alq3 molecules as the floating gate are fabricated and measured, showing durability over more than 104 program/erase cycles and the hysteresis window of up to 7.8 V, corresponding to stored charge densities as high as 5.4 × 1013 cm–2. These results demonstrate the potential for use of molecular films in high storage capacity nonvolatile memory cells.
Author Paydavosi, Sarah
Osedach, Timothy P
Brown, Patrick R
Aidala, Katherine E
Hoyt, Judy L
Hashemi, Pouya
Supran, Geoffrey J
Bulović, Vladimir
AuthorAffiliation Massachusetts Institute of Technology
Mount Holyoke College
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Issue 3
Keywords tris(8-hydroxyquinoline) aluminum
nonvolatile
Alq3
Kelvin force microscopy
Flash memory
charge storage
molecules
organic
Charge storage
Atomic force microscopy
Force measurement
Charge carriers
Capacitors
Hole density
High density
Aluminium compounds
Quinoline derivatives
Aluminium
Flash memories
Thin films
Charge density
Charge carrier trapping
Charge injection
Non volatile memory
Gallium tellurides
Electron density
Diffusion
Gates
Hysteresis
Via hole
Language English
License CC BY 4.0
2012 American Chemical Society
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Snippet Retention and diffusion of charge in tris­(8-hydroxyquinoline) aluminum (Alq3) molecular thin films are investigated by injecting electrons and holes via a...
Retention and diffusion of charge in tris(8-hydroxyquinoline) aluminum (Alq(3)) molecular thin films are investigated by injecting electrons and holes via a...
Retention and diffusion of charge in tris(8-hydroxyquinoline) aluminum (Alq sub(3)) molecular thin films are investigated by injecting electrons and holes via...
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SubjectTerms Aluminum
Charge
Computer Storage Devices
Condensed matter: structure, mechanical and thermal properties
Diffusion in nanoscale solids
Diffusion in solids
Durability
Energy Transfer
Equipment Design
Equipment Failure Analysis
Exact sciences and technology
Gates
Macromolecular Substances - chemistry
Materials Testing
Membranes, Artificial
Memory (computers)
Microscopy
Microscopy, Atomic Force - methods
Molecular Conformation
Nanostructure
Nanostructures - chemistry
Nanostructures - ultrastructure
Organometallic Compounds - chemistry
Particle Size
Physics
Static Electricity
Storage capacity
Surface Properties
Thin films
Transport properties of condensed matter (nonelectronic)
Title Detection of Charge Storage on Molecular Thin Films of Tris(8-hydroxyquinoline) Aluminum (Alq3) by Kelvin Force Microscopy: A Candidate System for High Storage Capacity Memory Cells
URI http://dx.doi.org/10.1021/nl203696v
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