Topographic Characterization of Cu–Ni NPs @ a‑C:H Films by AFM and Multifractal Analysis

• Published in: The journal of physical chemistry. B Vol. 119; no. 17; pp. 5662 - 5670
• Main Authors: Ţălu, Ştefan, Stach, Sebastian, Ghodselahi, Tayebeh, Ghaderi, Atefeh, Solaymani, Shahram, Boochani, Arash, Garczyk, Żaneta
• Format: Journal Article
• Language: English
• Published: United States American Chemical Society 30.04.2015
• Subjects: absorption; atomic force microscopy; carbon; copper; geometry; nanoparticles; nickel; radio waves; spectroscopy; surface plasmon resonance; topography; vapors; wavelengths

In the present work three-dimensional (3-D) surface topography of Cu–Ni nanoparticles in hydrogenated amorphous carbon (Cu–Ni NPs @ a-C:H) with constant thickness of Cu and three thicknesses of Ni prepared by RF-Plasma Enhanced Chemical Vapor Deposition (RF-PECVD) system were investigated. The thin...