Topographic Characterization of Cu–Ni NPs @ a‑C:H Films by AFM and Multifractal Analysis - Ţălu, Ştefan; Stach, Sebastian; Ghodselahi, Tayebeh; Ghaderi, Atefeh; Solaymani, Shahram; Boochani, Arash; Garczyk, Żaneta (The journal of physical chemistry. B, 2015)
Keywords: absorption; atomic force microscopy; carbon; copper; geometry; nanoparticles; nickel; radio waves; spectroscopy; surface plasmon resonance; topography; vapors; wavelengths