APA (7th ed.) Citation

Ţălu, S., Stach, S., Ghodselahi, T., Ghaderi, A., Solaymani, S., Boochani, A., & Garczyk, Z. (2015). Topographic Characterization of Cu–Ni NPs @ a‑C: H Films by AFM and Multifractal Analysis. The journal of physical chemistry. B, 119(17), 5662-5670. https://doi.org/10.1021/acs.jpcb.5b00042

Chicago Style (17th ed.) Citation

Ţălu, Ştefan, Sebastian Stach, Tayebeh Ghodselahi, Atefeh Ghaderi, Shahram Solaymani, Arash Boochani, and Żaneta Garczyk. "Topographic Characterization of Cu–Ni NPs @ A‑C: H Films by AFM and Multifractal Analysis." The Journal of Physical Chemistry. B 119, no. 17 (2015): 5662-5670. https://doi.org/10.1021/acs.jpcb.5b00042.

MLA (9th ed.) Citation

Ţălu, Ştefan, et al. "Topographic Characterization of Cu–Ni NPs @ A‑C: H Films by AFM and Multifractal Analysis." The Journal of Physical Chemistry. B, vol. 119, no. 17, 2015, pp. 5662-5670, https://doi.org/10.1021/acs.jpcb.5b00042.