Discerning Black Phosphorus Crystal Orientation and Anisotropy by Polarized Reflectance Measurement

• Published in: ACS applied materials & interfaces Vol. 10; no. 30; pp. 25629 - 25637
• Main Authors: Islam, Arnob, Du, Wei, Pashaei, Vida, Jia, Hao, Wang, Zenghui, Lee, Jaesung, Ye, Guo Jun, Chen, Xian Hui, Feng, Philip X.-L
• Format: Journal Article
• Language: English
• Published: United States American Chemical Society 01.08.2018
• Subjects: anisotropy; crystals; phosphorus; reflectance; polarized reflectance measurement; in-plane anisotropy; crystal orientation; black phosphorus; polarized Raman spectroscopy
• ISSN: 1944-8244; 1944-8252; 1944-8252
• DOI: 10.1021/acsami.8b05408

Strong in-plane anisotropy of atomic layer and thin-film black phosphorus (P) offers new device perspectives and stimulates increasing interest and explorations, where precisely determining the black P crystal orientation and anisotropic axes is a necessity. Here, we demonstrate that the crystal ori...