Quantification of Valleys of Randomly Textured Substrates as a Function of Opening Angle: Correlation to the Defect Density in Intrinsic nc-Si:H

• Published in: ACS applied materials & interfaces Vol. 8; no. 32; pp. 20660 - 20666
• Main Authors: Kim, Do Yun, Hänni, Simon, Schüttauf, Jan-Willem, van Swaaij, René A. C. M. M, Zeman, Miro
• Format: Journal Article
• Language: English
• Published: United States American Chemical Society 17.08.2016
• Subjects: electrical properties; light scattering; nanocrystals; photovoltaic cells; silicon; zinc oxide; opening angle; nc-Si:H; morphology; simulation; defect density; defective valleys; solar cell

Optical and electrical properties of hydrogenated nanocrystalline silicon (nc-Si:H) solar cells are strongly influenced by the morphology of underlying substrates. By texturing the substrates, the photogenerated current of nc-Si:H solar cells can increase due to enhanced light scattering. These text...