Quantification of Valleys of Randomly Textured Substrates as a Function of Opening Angle: Correlation to the Defect Density in Intrinsic nc-Si:H - Kim, Do Yun; Hänni, Simon; Schüttauf, Jan-Willem; van Swaaij, René A. C. M. M; Zeman, Miro (ACS applied materials & interfaces, 2016)
Keywords: electrical properties; light scattering; nanocrystals; photovoltaic cells; silicon; zinc oxide; opening angle; nc-Si:H; morphology; simulation; defect density; defective valleys; solar cell