APA (7th ed.) Citation

Kim, D. Y., Hänni, S., Schüttauf, J., van Swaaij, R. A. C. M. M., & Zeman, M. (2016). Quantification of Valleys of Randomly Textured Substrates as a Function of Opening Angle: Correlation to the Defect Density in Intrinsic nc-Si:H. ACS applied materials & interfaces, 8(32), 20660-20666. https://doi.org/10.1021/acsami.6b03995

Chicago Style (17th ed.) Citation

Kim, Do Yun, Simon Hänni, Jan-Willem Schüttauf, René A. C. M. M. van Swaaij, and Miro Zeman. "Quantification of Valleys of Randomly Textured Substrates as a Function of Opening Angle: Correlation to the Defect Density in Intrinsic Nc-Si:H." ACS Applied Materials & Interfaces 8, no. 32 (2016): 20660-20666. https://doi.org/10.1021/acsami.6b03995.

MLA (9th ed.) Citation

Kim, Do Yun, et al. "Quantification of Valleys of Randomly Textured Substrates as a Function of Opening Angle: Correlation to the Defect Density in Intrinsic Nc-Si:H." ACS Applied Materials & Interfaces, vol. 8, no. 32, 2016, pp. 20660-20666, https://doi.org/10.1021/acsami.6b03995.