Effects of Alkyl Amide Solvents on the Dispersion of Single-Wall Carbon Nanotubes

Stable dispersions of both as-produced (raw soot) and purified laser-generated single-wall carbon nanotubes (SWNTs) have been demonstrated with several alkyl amide solvents. Optical absorption analysis over a range of concentrations has been utilized to estimate the dispersion limits for as-produced...

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Bibliographic Details
Published inThe journal of physical chemistry. B Vol. 108; no. 44; pp. 17089 - 17095
Main Authors Landi, Brian J, Ruf, Herbert J, Worman, James J, Raffaelle, Ryne P
Format Journal Article
LanguageEnglish
Published American Chemical Society 04.11.2004
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Summary:Stable dispersions of both as-produced (raw soot) and purified laser-generated single-wall carbon nanotubes (SWNTs) have been demonstrated with several alkyl amide solvents. Optical absorption analysis over a range of concentrations has been utilized to estimate the dispersion limits for as-produced SWNTs in N,N-dimethylformamide (DMF), N,N-dimethylacetamide (DMA), N,N-diethylacetamide (DEA), and N,N-dimethylpropanamide (DMP). In addition, extinction coefficients have been calculated using Beer's law for each solvent at energies of 1.27 and 1.77 eV, corresponding to the electronic transitions of semiconducting and metallic SWNTs, respectively. The results imply that high polarizability and optimal geometries (appropriate bond lengths and bond angles) may account for the favorable interaction between SWNTs and the alkyl amide solvents. The successful dispersion of purified SWNTs in DMA has enabled extinction coefficients of 43.4 and 39.0 mL·mg-1·cm-1 to be calculated at the selected energies, respectively. The magnitude of the dispersion limit and extinction coefficient values has been shown to be strongly dependent on the SWNT sample purity. These findings offer the potential for solution-phase analysis of SWNTs directed at purity assessment and electrophoretic separations in a simple organic solvent.
Bibliography:istex:02DD3A325D5473CE5C5CD1CDE4DB7B37F3DF3E17
ark:/67375/TPS-1D92LK9D-2
ISSN:1520-6106
1520-5207
DOI:10.1021/jp047521j