Quantifying Liquid Transport and Patterning Using Atomic Force Microscopy

• Published in: Langmuir Vol. 33; no. 21; pp. 5173 - 5178
• Main Authors: Farmakidis, Nikolaos, Brown, Keith A
• Format: Journal Article
• Language: English
• Published: United States American Chemical Society 30.05.2017

Atomic force microscopy (AFM) provides unique insight into the nanoscale properties of materials. It has been challenging, however, to use AFM to study soft materials such as liquids or gels because of their tendency to flow in response to stress. We propose an AFM-based technique for quantitatively...