Depolarization as Driving Force in Antiferroelectric Hafnia and Ferroelectric Wake-Up

Antiferroelectricity and wake-up observed in thin hafnium-oxide-based ferroelectrics are examined from the viewpoint of a macroscopic, quantitative model incorporating depolarization effects. Depolarization fields arising from finite screening, a nonferroelectric interface, and a ferroelectric/parae...

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Published inACS applied electronic materials Vol. 2; no. 6; pp. 1583 - 1595
Main Authors Lomenzo, Patrick D, Richter, Claudia, Mikolajick, Thomas, Schroeder, Uwe
Format Journal Article
LanguageEnglish
Published American Chemical Society 23.06.2020
Subjects
dead layer
wake-up
size effect
ferroelectric HfO2
antiferroelectricity
depolarization
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ISSN2637-6113
2637-6113
DOI10.1021/acsaelm.0c00184

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Abstract Antiferroelectricity and wake-up observed in thin hafnium-oxide-based ferroelectrics are examined from the viewpoint of a macroscopic, quantitative model incorporating depolarization effects. Depolarization fields arising from finite screening, a nonferroelectric interface, and a ferroelectric/paraelectric phase mixture are shown to directly impact the switching properties and shape of ferroelectric hysteresis. Charge injection and trapping are used to demonstrate how the progressive stressing of a ferroelectric dead layer results in improved switching with electric-field cycling. The description of ferroelectric hysteresis is applied to HfO2-based ferroelectrics where the longstanding debate concerning wake-up cycling and antiferroelectric properties can be shown to be driven by depolarization mechanisms. The calculated hystereses combine quantitative accuracy, simplicity, and compatibility to multiple microscopic interpretations that show depolarization fields can be the driving force of a field-induced first-order phase transition underlying antiferroelectric behavior.
AbstractList Antiferroelectricity and wake-up observed in thin hafnium-oxide-based ferroelectrics are examined from the viewpoint of a macroscopic, quantitative model incorporating depolarization effects. Depolarization fields arising from finite screening, a nonferroelectric interface, and a ferroelectric/paraelectric phase mixture are shown to directly impact the switching properties and shape of ferroelectric hysteresis. Charge injection and trapping are used to demonstrate how the progressive stressing of a ferroelectric dead layer results in improved switching with electric-field cycling. The description of ferroelectric hysteresis is applied to HfO2-based ferroelectrics where the longstanding debate concerning wake-up cycling and antiferroelectric properties can be shown to be driven by depolarization mechanisms. The calculated hystereses combine quantitative accuracy, simplicity, and compatibility to multiple microscopic interpretations that show depolarization fields can be the driving force of a field-induced first-order phase transition underlying antiferroelectric behavior.
Author Lomenzo, Patrick D
Schroeder, Uwe
Richter, Claudia
Mikolajick, Thomas
AuthorAffiliation TU Dresden
Chair of Nanoelectronic Materials
AuthorAffiliation_xml – name: TU Dresden
– name: Chair of Nanoelectronic Materials
Author_xml – sequence: 1
  givenname: Patrick D
  orcidid: 0000-0001-8208-3871
  surname: Lomenzo
  fullname: Lomenzo, Patrick D
  email: patrick.lomenzo@namlab.com
– sequence: 2
  givenname: Claudia
  surname: Richter
  fullname: Richter, Claudia
– sequence: 3
  givenname: Thomas
  surname: Mikolajick
  fullname: Mikolajick, Thomas
  organization: TU Dresden
– sequence: 4
  givenname: Uwe
  orcidid: 0000-0002-6824-2386
  surname: Schroeder
  fullname: Schroeder, Uwe
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Cites_doi 10.1063/1.346948
10.1016/0038-1098(72)91180-5
10.1103/PhysRevB.82.014109
10.1002/aelm.201600173
10.1002/9783527654864.ch7
10.1103/PhysRev.91.513
10.1103/PhysRevB.90.140103
10.1080/00150197808236770
10.1103/PhysRevB.90.064111
10.1063/1.119781
10.1016/j.tsf.2016.07.009
10.1063/1.5128502
10.1063/1.114064
10.1016/j.pmatsci.2014.01.002
10.1109/NVMTS47818.2019.9043368
10.1063/1.126786
10.1038/srep04115
10.1021/acsami.9b11146
10.1103/PhysRev.35.269
10.1103/RevModPhys.77.1083
10.1063/1.5055258
10.1021/acsami.8b13173
10.1002/adma.200901756
10.1063/1.1308276
10.1016/j.nanoen.2014.09.025
10.1063/1.1381542
10.1063/1.2786013
10.1109/IRPS.2018.8353676
10.1063/1.5037185
10.1063/1.115531
10.1063/1.3490249
10.1002/aelm.201700131
10.1063/1.5023390
10.1002/admi.201701258
10.1103/PhysRev.83.1078
10.1063/1.4916715
10.1016/0022-3697(86)90042-9
10.1038/nature05148
10.1021/nl302049k
10.1063/1.4829064
10.1063/1.4902396
10.1109/NANO.2018.8626275
10.1063/1.4983031
10.1063/1.5129318
10.1021/am504837r
10.1063/1.4985297
10.1063/1.5019308
10.1109/TED.2019.2930749
10.1016/j.actamat.2018.12.008
10.1109/IEDM.2016.7838398
10.1039/C6CP07501K
10.1063/1.364239
10.1063/1.4811483
10.1063/1.1805190
10.1063/1.121554
10.1038/s41928-019-0305-3
10.1021/acsami.5b05773
10.1088/1361-6633/ab49d6
10.1063/1.5017094
10.1063/1.1662770
10.1038/s41467-019-10530-4
10.1109/TED.2013.2283465
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Keywords dead layer
wake-up
size effect
ferroelectric HfO2
antiferroelectricity
depolarization
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References ref9/cit9
ref45/cit45
ref3/cit3
ref27/cit27
ref56/cit56
ref16/cit16
ref52/cit52
ref23/cit23
ref8/cit8
ref31/cit31
ref59/cit59
ref2/cit2
ref34/cit34
ref37/cit37
ref20/cit20
ref48/cit48
ref60/cit60
ref17/cit17
ref10/cit10
ref35/cit35
ref53/cit53
ref19/cit19
ref21/cit21
ref42/cit42
ref46/cit46
ref49/cit49
ref13/cit13
ref61/cit61
ref24/cit24
ref38/cit38
ref50/cit50
ref54/cit54
ref6/cit6
ref36/cit36
ref18/cit18
ref11/cit11
ref25/cit25
ref29/cit29
ref32/cit32
ref39/cit39
ref14/cit14
ref57/cit57
ref5/cit5
ref51/cit51
ref43/cit43
ref28/cit28
ref40/cit40
ref26/cit26
ref55/cit55
ref12/cit12
ref15/cit15
ref62/cit62
ref41/cit41
ref58/cit58
ref22/cit22
ref33/cit33
ref4/cit4
ref30/cit30
ref47/cit47
ref1/cit1
ref44/cit44
ref7/cit7
References_xml – ident: ref25/cit25
  doi: 10.1063/1.346948
– ident: ref39/cit39
  doi: 10.1016/0038-1098(72)91180-5
– ident: ref49/cit49
  doi: 10.1103/PhysRevB.82.014109
– ident: ref37/cit37
  doi: 10.1002/aelm.201600173
– ident: ref45/cit45
  doi: 10.1002/9783527654864.ch7
– ident: ref33/cit33
  doi: 10.1103/PhysRev.91.513
– ident: ref54/cit54
  doi: 10.1103/PhysRevB.90.140103
– ident: ref3/cit3
  doi: 10.1080/00150197808236770
– ident: ref53/cit53
  doi: 10.1103/PhysRevB.90.064111
– ident: ref34/cit34
  doi: 10.1063/1.119781
– ident: ref57/cit57
  doi: 10.1016/j.tsf.2016.07.009
– ident: ref58/cit58
  doi: 10.1063/1.5128502
– ident: ref30/cit30
  doi: 10.1063/1.114064
– ident: ref44/cit44
  doi: 10.1016/j.pmatsci.2014.01.002
– ident: ref52/cit52
  doi: 10.1109/NVMTS47818.2019.9043368
– ident: ref23/cit23
  doi: 10.1063/1.126786
– ident: ref61/cit61
  doi: 10.1038/srep04115
– ident: ref41/cit41
  doi: 10.1021/acsami.9b11146
– ident: ref1/cit1
  doi: 10.1103/PhysRev.35.269
– ident: ref32/cit32
  doi: 10.1103/RevModPhys.77.1083
– ident: ref59/cit59
  doi: 10.1063/1.5055258
– ident: ref50/cit50
  doi: 10.1021/acsami.8b13173
– ident: ref35/cit35
  doi: 10.1002/adma.200901756
– ident: ref27/cit27
  doi: 10.1063/1.1308276
– ident: ref12/cit12
  doi: 10.1016/j.nanoen.2014.09.025
– ident: ref24/cit24
  doi: 10.1063/1.1381542
– ident: ref5/cit5
  doi: 10.1063/1.2786013
– ident: ref7/cit7
  doi: 10.1109/IRPS.2018.8353676
– ident: ref51/cit51
  doi: 10.1063/1.5037185
– ident: ref31/cit31
  doi: 10.1063/1.115531
– ident: ref29/cit29
  doi: 10.1063/1.3490249
– ident: ref56/cit56
  doi: 10.1002/aelm.201700131
– ident: ref13/cit13
  doi: 10.1063/1.5023390
– ident: ref47/cit47
  doi: 10.1002/admi.201701258
– ident: ref43/cit43
  doi: 10.1103/PhysRev.83.1078
– ident: ref6/cit6
  doi: 10.1063/1.4916715
– ident: ref28/cit28
  doi: 10.1016/0022-3697(86)90042-9
– ident: ref36/cit36
  doi: 10.1038/nature05148
– ident: ref21/cit21
  doi: 10.1021/nl302049k
– ident: ref20/cit20
  doi: 10.1063/1.4829064
– ident: ref2/cit2
  doi: 10.1063/1.4902396
– ident: ref10/cit10
  doi: 10.1109/NANO.2018.8626275
– ident: ref9/cit9
  doi: 10.1063/1.4983031
– ident: ref60/cit60
  doi: 10.1063/1.5129318
– ident: ref22/cit22
  doi: 10.1021/am504837r
– ident: ref55/cit55
  doi: 10.1063/1.4985297
– ident: ref14/cit14
  doi: 10.1063/1.5019308
– ident: ref17/cit17
  doi: 10.1109/TED.2019.2930749
– ident: ref62/cit62
  doi: 10.1016/j.actamat.2018.12.008
– ident: ref16/cit16
  doi: 10.1109/IEDM.2016.7838398
– ident: ref42/cit42
  doi: 10.1039/C6CP07501K
– ident: ref26/cit26
  doi: 10.1063/1.364239
– ident: ref46/cit46
  doi: 10.1063/1.4811483
– ident: ref40/cit40
  doi: 10.1063/1.1805190
– ident: ref4/cit4
  doi: 10.1063/1.121554
– ident: ref11/cit11
  doi: 10.1038/s41928-019-0305-3
– ident: ref19/cit19
  doi: 10.1021/acsami.5b05773
– ident: ref8/cit8
  doi: 10.1088/1361-6633/ab49d6
– ident: ref18/cit18
  doi: 10.1063/1.5017094
– ident: ref38/cit38
  doi: 10.1063/1.1662770
– ident: ref48/cit48
  doi: 10.1038/s41467-019-10530-4
– ident: ref15/cit15
  doi: 10.1109/TED.2013.2283465
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Snippet Antiferroelectricity and wake-up observed in thin hafnium-oxide-based ferroelectrics are examined from the viewpoint of a macroscopic, quantitative model...
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Title Depolarization as Driving Force in Antiferroelectric Hafnia and Ferroelectric Wake-Up
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