Understanding Capacitance Variation in Sub-nanometer Pores by in Situ Tuning of Interlayer Constrictions - Galhena, Dona T. L; Bayer, Bernhard C; Hofmann, Stephan; Amaratunga, Gehan A. J (ACS nano, 2016)
Keywords: in situ X-ray diffractometry; graphene oxide; interlayer constrictions; electrical double-layer capacitors; supercapacitors; subnanometer pores