Xu, W., Chen, H., Chen, W., Tian, X., & Zhao, H. (2013). Modeling Study of the Valid Apparent Interface Thickness in Particulate Materials with Ellipsoidal Particles. Industrial & engineering chemistry research, 52(48), 17171-17178. https://doi.org/10.1021/ie403009c
Chicago Style (17th ed.) CitationXu, Wenxiang, Huisu Chen, Wen Chen, Xia Tian, and Haitao Zhao. "Modeling Study of the Valid Apparent Interface Thickness in Particulate Materials with Ellipsoidal Particles." Industrial & Engineering Chemistry Research 52, no. 48 (2013): 17171-17178. https://doi.org/10.1021/ie403009c.
MLA (9th ed.) CitationXu, Wenxiang, et al. "Modeling Study of the Valid Apparent Interface Thickness in Particulate Materials with Ellipsoidal Particles." Industrial & Engineering Chemistry Research, vol. 52, no. 48, 2013, pp. 17171-17178, https://doi.org/10.1021/ie403009c.