Determination of Single-Bond Forces from Contact Force Variances in Atomic Force Microscopy
Atomic force microscopy contact forces are shown to obey a Poisson distribution, so that the ratio of their variance to mean gives the force of a single chemical bond between the tip and sample. The derived single-bond force was able to distinguish nominal van der Waals interactions (60 ± 3 pN) from...
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Published in | Langmuir Vol. 12; no. 5; pp. 1291 - 1295 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
Washington, DC
American Chemical Society
06.03.1996
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Subjects | |
Online Access | Get full text |
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