Determination of Single-Bond Forces from Contact Force Variances in Atomic Force Microscopy
Atomic force microscopy contact forces are shown to obey a Poisson distribution, so that the ratio of their variance to mean gives the force of a single chemical bond between the tip and sample. The derived single-bond force was able to distinguish nominal van der Waals interactions (60 ± 3 pN) from...
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| Published in | Langmuir Vol. 12; no. 5; pp. 1291 - 1295 |
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| Main Authors | , , |
| Format | Journal Article |
| Language | English |
| Published |
Washington, DC
American Chemical Society
06.03.1996
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| Abstract | Atomic force microscopy contact forces are shown to obey a Poisson distribution, so that the ratio of their variance to mean gives the force of a single chemical bond between the tip and sample. The derived single-bond force was able to distinguish nominal van der Waals interactions (60 ± 3 pN) from hydrogen-bond interactions (181 ± 35 pN) between atomic force microscope tips and gold and mica surfaces, respectively. This technique greatly reduced sampling time and sample wear, allowed quantitative use of low-resolution force data from a commercially available instrument, and detected important chemical differences between surface functional groups on the samples. These experiments constitute an important step in obtaining chemically specific information in atomic force microscopy. |
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| AbstractList | Atomic force microscopy contact forces are shown to obey a Poisson distribution, so that the ratio of their variance to mean gives the force of a single chemical bond between the tip and sample. The derived single-bond force was able to distinguish nominal van der Waals interactions (60 ± 3 pN) from hydrogen-bond interactions (181 ± 35 pN) between atomic force microscope tips and gold and mica surfaces, respectively. This technique greatly reduced sampling time and sample wear, allowed quantitative use of low-resolution force data from a commercially available instrument, and detected important chemical differences between surface functional groups on the samples. These experiments constitute an important step in obtaining chemically specific information in atomic force microscopy. |
| Author | Beebe, Thomas P Williams, John M Han, Taejoon |
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| Copyright | Copyright © 1996 American Chemical Society 1996 INIST-CNRS |
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| Keywords | Van der Waals binding Atomic force microscopy Gold Hydrogen bonds Scanning probe microscopy Chemical bonds Mechanical contacts Experimental study Mica |
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| Notes | istex:0C8DD954C5BC9F0E7A0236617DE9452F0F37C2E8 ark:/67375/TPS-X78MZQBS-X Abstract published in Advance ACS Abstracts, January 1, 1996. |
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| Snippet | Atomic force microscopy contact forces are shown to obey a Poisson distribution, so that the ratio of their variance to mean gives the force of a single... |
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| SubjectTerms | Atomic force microscopes Exact sciences and technology Instruments, apparatus, components and techniques common to several branches of physics and astronomy Physics Scanning probe microscopes, components and techniques |
| Title | Determination of Single-Bond Forces from Contact Force Variances in Atomic Force Microscopy |
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