Towards the generation of machine learning defect reports

• Published in: IEEE/ACM International Conference on Automated Software Engineering : [proceedings] pp. 1038 - 1042
• Main Author: Lai, Tuan Dung
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.11.2021
• Subjects: Computer bugs; Knowledge engineering; Machine learning; Production systems; Protocols; Software systems; Training

Effective locating and fixing defects requires detailed defect reports. Unlike traditional software systems, machine learning applications are subject defects caused from changes in the input data streams (concept drift) and assumptions encoded into models. Without appropriate training, developers f...