Impact of Code Language Models on Automated Program Repair

Automated program repair (APR) aims to help developers improve software reliability by generating patches for buggy programs. Although many code language models (CLM) are developed and effective in many software tasks such as code completion, there has been little comprehensive, in-depth work to eva...

Full description

Saved in:
Bibliographic Details
Published inProceedings / International Conference on Software Engineering pp. 1430 - 1442
Main Authors Jiang, Nan, Liu, Kevin, Lutellier, Thibaud, Tan, Lin
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.05.2023
Subjects
Online AccessGet full text

Cover

Loading…
Abstract Automated program repair (APR) aims to help developers improve software reliability by generating patches for buggy programs. Although many code language models (CLM) are developed and effective in many software tasks such as code completion, there has been little comprehensive, in-depth work to evaluate CLMs' fixing capabilities and to fine-tune CLMs for the APR task. Firstly, this work is the first to evaluate ten CLMs on four APR benchmarks, which shows that surprisingly, the best CLM, as is, fixes 72% more bugs than the state-of-the-art deep-learning (DL)-based APR techniques. Secondly, one of the four APR benchmarks was created by us in this paper to avoid data leaking for a fair evaluation. Thirdly, it is the first work to fine-tune CLMs with APR training data, which shows that fine-tuning brings 31%-1,267% improvement to CLMs and enables them to fix 46%-164 % more bugs than existing DL-based APR techniques. Fourthly, this work studies the impact of buggy lines, showing that CLMs, as is, cannot make good use of the buggy lines to fix bugs, yet fine-tuned CLMs could potentially over-rely on buggy lines. Lastly, this work analyzes the size, time, and memory efficiency of different CLMs. This work shows promising directions for the APR domain, such as fine-tuning CLMs with APR-specific designs, and also raises awareness of fair and comprehensive evaluations of CLMs and calls for more transparent reporting of open-source repositories used in the pre-training data to address the data leaking problem.
AbstractList Automated program repair (APR) aims to help developers improve software reliability by generating patches for buggy programs. Although many code language models (CLM) are developed and effective in many software tasks such as code completion, there has been little comprehensive, in-depth work to evaluate CLMs' fixing capabilities and to fine-tune CLMs for the APR task. Firstly, this work is the first to evaluate ten CLMs on four APR benchmarks, which shows that surprisingly, the best CLM, as is, fixes 72% more bugs than the state-of-the-art deep-learning (DL)-based APR techniques. Secondly, one of the four APR benchmarks was created by us in this paper to avoid data leaking for a fair evaluation. Thirdly, it is the first work to fine-tune CLMs with APR training data, which shows that fine-tuning brings 31%-1,267% improvement to CLMs and enables them to fix 46%-164 % more bugs than existing DL-based APR techniques. Fourthly, this work studies the impact of buggy lines, showing that CLMs, as is, cannot make good use of the buggy lines to fix bugs, yet fine-tuned CLMs could potentially over-rely on buggy lines. Lastly, this work analyzes the size, time, and memory efficiency of different CLMs. This work shows promising directions for the APR domain, such as fine-tuning CLMs with APR-specific designs, and also raises awareness of fair and comprehensive evaluations of CLMs and calls for more transparent reporting of open-source repositories used in the pre-training data to address the data leaking problem.
Author Liu, Kevin
Lutellier, Thibaud
Tan, Lin
Jiang, Nan
Author_xml – sequence: 1
  givenname: Nan
  surname: Jiang
  fullname: Jiang, Nan
  email: jiang719@purdue.edu
  organization: Purdue University,West Lafayette,USA
– sequence: 2
  givenname: Kevin
  surname: Liu
  fullname: Liu, Kevin
  email: kevin.bx.liu@gmail.com
  organization: Lynbrook High School,San Jose,USA
– sequence: 3
  givenname: Thibaud
  surname: Lutellier
  fullname: Lutellier, Thibaud
  email: lutellie@ualberta.ca
  organization: University of Alberta,Alberta,Canada
– sequence: 4
  givenname: Lin
  surname: Tan
  fullname: Tan, Lin
  email: lintan@purdue.edu
  organization: Purdue University,West Lafayette,USA
BookMark eNotzMtKxDAUgOEoCo5j32AWeYHWnJMmadwNZdRCRfGyHk7T01KYXmg7C99eQVc_3-a_FVfDOLAQO1AJgPL3Rf5xSDMLPkGFOlEK0FyIyLsMrDWpcQr8pdiAMVkMiOZGRMvSVcqAR9DKbsRD0U8UVjk2Mh9rliUN7Zlali-_Oi1yHOT-vI49rVzLt3lsZ-rlO0_UzXfiuqHTwtF_t-Lr8fCZP8fl61OR78uYMLNrHCALyvkGQqiYg7c2VBgcOks2QwpcswlBIwSrq4ax9qltKiKtKqi99nordn_fjpmP09z1NH8fQYFDA07_AB1-Sus
CODEN IEEPAD
ContentType Conference Proceeding
DBID 6IE
6IH
CBEJK
RIE
RIO
DOI 10.1109/ICSE48619.2023.00125
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan (POP) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Electronic Library (IEL)
IEEE Proceedings Order Plans (POP) 1998-present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Computer Science
EISBN 9781665457019
1665457015
EISSN 1558-1225
EndPage 1442
ExternalDocumentID 10172517
Genre orig-research
GroupedDBID -~X
.4S
.DC
123
23M
29O
5VS
6IE
6IF
6IH
6IK
6IL
6IM
6IN
8US
AAJGR
AAWTH
ABLEC
ADZIZ
AFFNX
ALMA_UNASSIGNED_HOLDINGS
APO
ARCSS
AVWKF
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
CHZPO
EDO
FEDTE
I-F
I07
IEGSK
IJVOP
IPLJI
M43
OCL
RIE
RIL
RIO
RNS
XOL
ID FETCH-LOGICAL-a286t-c18c079f1ccbeec966cb2c7276a682acede5cc321c63bfe2d946fbaa30b1d9393
IEDL.DBID RIE
IngestDate Wed Aug 27 02:09:24 EDT 2025
IsPeerReviewed false
IsScholarly true
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-a286t-c18c079f1ccbeec966cb2c7276a682acede5cc321c63bfe2d946fbaa30b1d9393
PageCount 13
ParticipantIDs ieee_primary_10172517
PublicationCentury 2000
PublicationDate 2023-May
PublicationDateYYYYMMDD 2023-05-01
PublicationDate_xml – month: 05
  year: 2023
  text: 2023-May
PublicationDecade 2020
PublicationTitle Proceedings / International Conference on Software Engineering
PublicationTitleAbbrev ICSE
PublicationYear 2023
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssib051921306
ssj0006499
Score 2.60809
Snippet Automated program repair (APR) aims to help developers improve software reliability by generating patches for buggy programs. Although many code language...
SourceID ieee
SourceType Publisher
StartPage 1430
SubjectTerms Automated Program Repair
Benchmark testing
Code Language Model
Codes
Computer bugs
Deep Learning
Fine-Tuning
Maintenance engineering
Memory management
Software
Training data
Title Impact of Code Language Models on Automated Program Repair
URI https://ieeexplore.ieee.org/document/10172517
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LSwMxEA7Wk6f6qPgmB6-7TTbZdNeblJZWpAha6K0kkwmI0pW6e_HXm-xDRRC8LQsbQjLZmcnM932EXHOdcuM0Rnpk00gqk0TGsVGE0kkNBpho2D4XaraUd6t01YLVaywMItbNZxiHx7qWbwuowlXZMJhPoNjqkZ7P3BqwVmc8aSD2EqFk2P6GlY_lW6wcZ_lwPn6cyMynC3EQDA8FiKCO_UNRpXYo0z5ZdFNp-khe4qo0MXz8Ymn891z3yeAbu0cfvrzSAdnBzSHpd-INtD3LR-RmXuMjaeHouLBI79uLSxrU0V7fabGht1VZ-IAWbRgwdHFRH67r5-2ALKeTp_EsaoUUIp1kqoyAZ8BGueMABhF8hgMmAR-5KK2yRANaTAFEwkEJ4zCxuVTOaC2Y4TYXuTgmu5tigyeEJqnI0QnDFWqpGTOZY0Zbqbj_InfslAzCWqzfGq6MdbcMZ3-8Pyd7YT-aFsILsltuK7z0br40V_X2fgKSgKaW
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1JSwMxFA5aD3qqS8XdHLzONJlk0hlvUiyt1iLYQm8lywuIMiN15uKvN5lFRRC8hUBCyPZe8t73fQhdURlTZSUEcmDigAsVBcqSQQDccqmVJqxm-5yJ8YLfLeNlA1avsDAAUCWfQeiLVSzf5Lr0X2V9v308xdYm2nKGP6Y1XKvdPrGn9mI-aNhcxMJ58w1ajpK0Pxk-3fLEPRhCLxnuQxBeH_uHpkplUkZdNGsHU2eSvIRloUL98Yun8d-j3UW9b_QefvyyS3toA7J91G3lG3Bzmg_Q9aRCSOLc4mFuAE-br0vs9dFe33Ge4ZuyyJ1LC8Z36PO4sHPY5fO6hxaj2_lwHDRSCoGMElEEmiaaDFJLtVYA2r1xtIq0812EFEkkNRiItWYR1YIpC5FJubBKSkYUNSlL2SHqZHkGRwhHMUvBMkUFSC4JUYklShouqGuRWnKMen4uVm81W8aqnYaTP-ov0fZ4_jBdTSez-1O049emTig8Q51iXcK5M_qFuqiW-hN23Knf
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=Proceedings+%2F+International+Conference+on+Software+Engineering&rft.atitle=Impact+of+Code+Language+Models+on+Automated+Program+Repair&rft.au=Jiang%2C+Nan&rft.au=Liu%2C+Kevin&rft.au=Lutellier%2C+Thibaud&rft.au=Tan%2C+Lin&rft.date=2023-05-01&rft.pub=IEEE&rft.eissn=1558-1225&rft.spage=1430&rft.epage=1442&rft_id=info:doi/10.1109%2FICSE48619.2023.00125&rft.externalDocID=10172517