APA (7th ed.) Citation

Wang, Z., You, H., Chen, J., Zhang, Y., Dong, X., & Zhang, W. (2021, May). Prioritizing Test Inputs for Deep Neural Networks via Mutation Analysis. Proceedings / International Conference on Software Engineering, 397-409. https://doi.org/10.1109/ICSE43902.2021.00046

Chicago Style (17th ed.) Citation

Wang, Zan, Hanmo You, Junjie Chen, Yingyi Zhang, Xuyuan Dong, and Wenbin Zhang. "Prioritizing Test Inputs for Deep Neural Networks via Mutation Analysis." Proceedings / International Conference on Software Engineering May. 2021: 397-409. https://doi.org/10.1109/ICSE43902.2021.00046.

MLA (9th ed.) Citation

Wang, Zan, et al. "Prioritizing Test Inputs for Deep Neural Networks via Mutation Analysis." Proceedings / International Conference on Software Engineering, May. 2021, pp. 397-409, https://doi.org/10.1109/ICSE43902.2021.00046.