Address-Value Delta (AVD) Prediction: Increasing the Effectiveness of Runahead Execution by Exploiting Regular Memory Allocation Patterns - Mutlu, Onur; Kim, Hyesoon; Patt, Yale N. (38th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO'05), 2005)
Keywords: Arithmetic; Data structures; Delay; Energy consumption; Hardware -- Electronic design automation -- High-level and register-transfer level synthesis; Hardware -- Integrated circuits; Hardware -- Integrated circuits -- Semiconductor memory; Microprocessors; Pattern analysis; Process design; Random access memory; Registers; Switches