A High-Sensitivity Refractive Index Sensor with Period-Doubling Plasmonic Metasurfaces to Engineer the Radiation Losses

Saved in:
Bibliographic Details
Published inACS applied optical materials Vol. 1; no. 3; pp. 736 - 744
Main Authors Li, Shuai, Jiang, Hui, Zhu, Xiaojun, Shi, Yuechun, Han, Zhanghua
Format Journal Article
LanguageEnglish
Published 24.03.2023
Online AccessGet full text
ISSN2771-9855
2771-9855
DOI10.1021/acsaom.2c00183

Cover

Author Han, Zhanghua
Li, Shuai
Zhu, Xiaojun
Jiang, Hui
Shi, Yuechun
Author_xml – sequence: 1
  givenname: Shuai
  surname: Li
  fullname: Li, Shuai
  organization: The School of Information Science and Technology, Nantong University, Nantong 226019, China, Shandong Provincial Key Laboratory of Optics and Photonic Devices and Shandong Provincial Engineering and Technical Center of Light Manipulations, School of Physics and Electronics, Shandong Normal University, Jinan, Shandong 250358, China
– sequence: 2
  givenname: Hui
  surname: Jiang
  fullname: Jiang, Hui
  organization: Shandong Provincial Key Laboratory of Optics and Photonic Devices and Shandong Provincial Engineering and Technical Center of Light Manipulations, School of Physics and Electronics, Shandong Normal University, Jinan, Shandong 250358, China
– sequence: 3
  givenname: Xiaojun
  surname: Zhu
  fullname: Zhu, Xiaojun
  organization: The School of Information Science and Technology, Nantong University, Nantong 226019, China
– sequence: 4
  givenname: Yuechun
  surname: Shi
  fullname: Shi, Yuechun
  organization: Yongjiang Laboratory, Ningbo, Zhejiang 315202, China, Key Laboratory of Intelligent Optical Sensing and Manipulation, Ministry of Education, Nanjing University, Nanjing 210093, China
– sequence: 5
  givenname: Zhanghua
  orcidid: 0000-0002-4177-2555
  surname: Han
  fullname: Han, Zhanghua
  organization: Shandong Provincial Key Laboratory of Optics and Photonic Devices and Shandong Provincial Engineering and Technical Center of Light Manipulations, School of Physics and Electronics, Shandong Normal University, Jinan, Shandong 250358, China
BookMark eNp1kE9PAjEQxRuDiYhcPfcLLLb7r7tHgigkGAnqeTPbnULN0pq2iHx7F-FgTDzNTF7ezJvfNekZa5CQW85GnMX8DqQHux3FkjFeJBekHwvBo7LIst6v_ooMvX9njCWMlSzP-mQ_pjO93kQvaLwO-lOHA12hciC7AencNPhFj6J1dK_Dhi7RadtE93ZXt9qs6bIFv7VGS_qEAfzOKZDoabB0atbaIDoaNkhX0GgI2hq6sN6jvyGXClqPw3MdkLeH6etkFi2eH-eT8SKCWKQh4qqLLRpViLwuk1JkBdasLruH4hRKGctGcgFNwXJWchUnKShIkctGoBB1LpMBGZ32StfddaiqD6e34A4VZ9WRXHUiV53JdYb0j0Hq8JM8ONDtf7ZvgCJ4fg
CitedBy_id crossref_primary_10_1364_BOE_518910
crossref_primary_10_1103_PhysRevApplied_22_054002
crossref_primary_10_3390_cryst15010096
crossref_primary_10_1364_OE_542260
crossref_primary_10_1088_1361_6463_ad59af
crossref_primary_10_1063_5_0238353
crossref_primary_10_1016_j_sbsr_2024_100676
crossref_primary_10_1021_acsanm_4c00857
crossref_primary_10_1021_acsomega_3c07809
Cites_doi 10.1038/nmat852
10.1073/pnas.0907459106
10.1515/nanoph-2022-0311
10.1002/adfm.202104652
10.1002/adom.202200965
10.3390/bios11070221
10.1016/j.bios.2017.08.038
10.1021/nl400689q
10.1515/nanoph-2021-0368
10.1038/NPHOTON.2015.142
10.1364/OE.411749
10.1002/adom.201900516
10.1002/adma.201202109
10.1002/smll.201403422
10.1038/s41566-019-0394-6
10.1002/adom.201400208
10.1016/j.snb.2011.01.059
10.1038/natrevmats.2016.48
10.1063/1.1862340
10.1063/1.2939249
10.1021/nl2010862
10.1039/c7tb00777a
10.3390/bios11070233
10.1364/OPEX.12.006141
10.1002/lpor.201600312
10.1103/PhysRevLett.121.193903
10.1103/PhysRevLett.101.087403
10.1002/adom.202200954
10.1016/j.diamond.2022.109644
10.1038/ncomms6753
10.1088/0034-4885/76/1/016402
10.1038/s41467-021-23257-y
10.1038/ncomms3381
10.1021/nl102572q
10.1364/OL.23.001331
10.1016/j.optlastec.2021.107072
10.1038/nmat2162
10.1021/acsphotonics.1c01651
10.1002/inf2.12148
10.1038/s41586-018-0421-7
10.1515/zna-2016-0434
10.1038/NPHOTON.2015.205
10.1126/science.abq7870
ContentType Journal Article
DBID AAYXX
CITATION
DOI 10.1021/acsaom.2c00183
DatabaseName CrossRef
DatabaseTitle CrossRef
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISSN 2771-9855
EndPage 744
ExternalDocumentID 10_1021_acsaom_2c00183
GroupedDBID AAYXX
ABBLG
ABJNI
ABLBI
ABQRX
ACS
ALMA_UNASSIGNED_HOLDINGS
BAANH
CITATION
CUPRZ
EBS
GGK
VF5
VG9
ID FETCH-LOGICAL-a274t-1f9857df876b939758eb0b927724a9c2cdc17ad806091f234afa4e1cd7e77b6c3
IEDL.DBID ACS
ISSN 2771-9855
IngestDate Thu Apr 24 22:51:16 EDT 2025
Tue Jul 01 03:07:53 EDT 2025
IsPeerReviewed true
IsScholarly true
Issue 3
Language English
License https://doi.org/10.15223/policy-029
https://doi.org/10.15223/policy-037
https://doi.org/10.15223/policy-045
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-a274t-1f9857df876b939758eb0b927724a9c2cdc17ad806091f234afa4e1cd7e77b6c3
ORCID 0000-0002-4177-2555
PageCount 9
ParticipantIDs crossref_primary_10_1021_acsaom_2c00183
crossref_citationtrail_10_1021_acsaom_2c00183
ProviderPackageCode CITATION
AAYXX
PublicationCentury 2000
PublicationDate 2023-03-24
PublicationDateYYYYMMDD 2023-03-24
PublicationDate_xml – month: 03
  year: 2023
  text: 2023-03-24
  day: 24
PublicationDecade 2020
PublicationTitle ACS applied optical materials
PublicationYear 2023
References ref9/cit9
ref6/cit6
ref36/cit36
ref3/cit3
ref27/cit27
ref18/cit18
ref11/cit11
ref25/cit25
ref16/cit16
ref29/cit29
ref32/cit32
ref23/cit23
ref39/cit39
ref14/cit14
ref8/cit8
ref5/cit5
ref31/cit31
ref2/cit2
ref43/cit43
ref34/cit34
ref37/cit37
ref28/cit28
ref40/cit40
ref20/cit20
ref17/cit17
ref10/cit10
ref26/cit26
ref35/cit35
ref19/cit19
ref21/cit21
ref12/cit12
ref15/cit15
ref42/cit42
ref41/cit41
ref22/cit22
ref13/cit13
ref33/cit33
ref4/cit4
ref30/cit30
ref1/cit1
ref24/cit24
ref38/cit38
ref7/cit7
References_xml – ident: ref18/cit18
  doi: 10.1038/nmat852
– ident: ref26/cit26
  doi: 10.1073/pnas.0907459106
– ident: ref23/cit23
  doi: 10.1515/nanoph-2022-0311
– ident: ref36/cit36
  doi: 10.1002/adfm.202104652
– ident: ref8/cit8
  doi: 10.1002/adom.202200965
– ident: ref40/cit40
  doi: 10.3390/bios11070221
– ident: ref14/cit14
  doi: 10.1016/j.bios.2017.08.038
– ident: ref27/cit27
  doi: 10.1021/nl400689q
– ident: ref29/cit29
  doi: 10.1515/nanoph-2021-0368
– ident: ref9/cit9
  doi: 10.1038/NPHOTON.2015.142
– ident: ref5/cit5
  doi: 10.1364/OE.411749
– ident: ref12/cit12
  doi: 10.1002/adom.201900516
– ident: ref6/cit6
  doi: 10.1002/adma.201202109
– ident: ref10/cit10
  doi: 10.1002/smll.201403422
– ident: ref37/cit37
  doi: 10.1038/s41566-019-0394-6
– ident: ref42/cit42
  doi: 10.1002/adom.201400208
– ident: ref1/cit1
  doi: 10.1016/j.snb.2011.01.059
– ident: ref7/cit7
  doi: 10.1038/natrevmats.2016.48
– ident: ref19/cit19
  doi: 10.1063/1.1862340
– ident: ref33/cit33
  doi: 10.1063/1.2939249
– ident: ref24/cit24
  doi: 10.1021/nl2010862
– ident: ref13/cit13
  doi: 10.1039/c7tb00777a
– ident: ref2/cit2
  doi: 10.3390/bios11070233
– ident: ref17/cit17
  doi: 10.1364/OPEX.12.006141
– ident: ref3/cit3
  doi: 10.1002/lpor.201600312
– ident: ref20/cit20
  doi: 10.1103/PhysRevLett.121.193903
– ident: ref25/cit25
  doi: 10.1103/PhysRevLett.101.087403
– ident: ref41/cit41
  doi: 10.1002/adom.202200954
– ident: ref31/cit31
  doi: 10.1016/j.diamond.2022.109644
– ident: ref35/cit35
  doi: 10.1038/ncomms6753
– ident: ref34/cit34
  doi: 10.1088/0034-4885/76/1/016402
– ident: ref38/cit38
  doi: 10.1038/s41467-021-23257-y
– ident: ref43/cit43
  doi: 10.1038/ncomms3381
– ident: ref15/cit15
  doi: 10.1021/nl102572q
– ident: ref16/cit16
  doi: 10.1364/OL.23.001331
– ident: ref28/cit28
  doi: 10.1016/j.optlastec.2021.107072
– ident: ref30/cit30
  doi: 10.1038/nmat2162
– ident: ref32/cit32
  doi: 10.1021/acsphotonics.1c01651
– ident: ref4/cit4
  doi: 10.1002/inf2.12148
– ident: ref21/cit21
  doi: 10.1038/s41586-018-0421-7
– ident: ref39/cit39
  doi: 10.1515/zna-2016-0434
– ident: ref11/cit11
  doi: 10.1038/NPHOTON.2015.205
– ident: ref22/cit22
  doi: 10.1126/science.abq7870
SSID ssj0003009065
Score 2.3070025
SourceID crossref
SourceType Enrichment Source
Index Database
StartPage 736
Title A High-Sensitivity Refractive Index Sensor with Period-Doubling Plasmonic Metasurfaces to Engineer the Radiation Losses
Volume 1
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LS8NAEF6kJz34FuuLPQietmbTbDY5lmKpYqW0FnoLm31ctI20qYK_3pkkrcUies7kwcyG_WZ25vsIueaR1kgLzoxzkKDA_8ai2FqmpLQijKyxAc47957C7ih4GIvxd73j5wm-z2-Vnqts0vA16scVtJ6QzSEGag9XxZQmIAWvkI30peQsjoRYEjRuPGFtA1rbSTp7Ja3RvCAgxAaSl8YiTxv6c5Oe8c-P3Ce7FZykrTL-B2TLTg_JzhrJ4BH5aFFs5mBDbFUvtSLowLpiOurd0nukS6R4MZtRrMrSPtyYGQbQOsVZddoHgD1BBl3aszlWFB22cdE8o8v3UECRdIAsBxhm-pjhSfIxGXXunttdVsktMAUuzRl34DdpHMQrjQGmiMimXhqDR_1AxdrXRnOpTOSFgDGc3wyUU4Hl2kgrZRrq5gmpTbOpPSU0CI2JuYqdp-IgckJJyJO8FOy4cELYOmHLGCS64iJHSYzXpDgT93lSOjSpHFonNyv7t5KF4xfLs39bnpNtlI7HfjI_uCC1fLawlwAw8vSqWFxfIWvOqA
linkProvider American Chemical Society
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=A+High-Sensitivity+Refractive+Index+Sensor+with+Period-Doubling+Plasmonic+Metasurfaces+to+Engineer+the+Radiation+Losses&rft.jtitle=ACS+applied+optical+materials&rft.au=Li%2C+Shuai&rft.au=Jiang%2C+Hui&rft.au=Zhu%2C+Xiaojun&rft.au=Shi%2C+Yuechun&rft.date=2023-03-24&rft.issn=2771-9855&rft.eissn=2771-9855&rft.volume=1&rft.issue=3&rft.spage=736&rft.epage=744&rft_id=info:doi/10.1021%2Facsaom.2c00183&rft.externalDBID=n%2Fa&rft.externalDocID=10_1021_acsaom_2c00183
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=2771-9855&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=2771-9855&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=2771-9855&client=summon