A Mechanism for Online Diagnosis of Hard Faults in Microprocessors - Bower, Fred A.; Sorin, Daniel J.; Ozev, Sule (38th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO'05), 2005)
Keywords: Circuit faults; Costs; Degradation; Electromigration; Error correction; Fault detection; Fault diagnosis; Hardware -- Hardware test; Hardware -- Integrated circuits; Hardware -- Robustness; Microprocessors; Temperature; Wire